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How Accurately Can the Surface Resistance of Various Superconducting Films Be Measured with the Sapphire Hakki–Coleman Dielectric Resonator Technique?

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Abstract

It has been shown in the past that a random uncertainty in surface resistance measurements of HTS films as low as 1.1% can be achieved. However for comparative studies between differing samples and different laboratories the absolute uncertainty should be used instead. In this paper we discuss random and absolute uncertainties of R S measurements for three types of superconducting thin films, namely YBa2Cu3O7−δ, Tl(Ba,Sr)2Ca2Cu3Oy, and MgB2 when using an optimized Hakki–Coleman dielectric resonator.

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References

  1. B. W. Hakki and P. D. Coleman, IEEE Trans. MTT 8, 402 (1960).

    Article  Google Scholar 

  2. J. Fiedziuszko and P. Heidmann, MTT-S Digest, 555 (1989).

  3. J.-C. Mage and D. Dieumegard, Proc. AGARD Conf., 10–1 (1990).

  4. Y. Kobayashi, T. Imai, and H. Kayano, MTT-S Digest, 281 (1990).

  5. O. Llopis and J. Graffeuil, J. Less-Common Metals 164, 1248 (1990).

    Article  Google Scholar 

  6. N. Klein et al., J. Supercond. 5, 195 (1992).

    Article  ADS  Google Scholar 

  7. Z.-Y. Shen et al., IEEE MTT, 40, 2424 (1992).

    Article  Google Scholar 

  8. C. Wilker et al., IEEE Trans. Appl. Supercond. 3, 1457 (1993).

    Article  Google Scholar 

  9. J. Krupka et al., IEEE Trans. Appl. Supercond. 30, 3043 (1993).

    Article  Google Scholar 

  10. C. D. Langham and J. C. Gallop, IEEE Trans. Instru. Meas. 42, 96 (1993).

    Article  Google Scholar 

  11. R. Flether and J. Cook, Rev. Sci. Instrum. 65, 8, 2658 (1994).

    Article  ADS  Google Scholar 

  12. N. Tellmann et al., IEEE Trans. Appl. Supercond. 4, 143 (1994).

    Article  Google Scholar 

  13. A. Mourachkine and A. Barel. IEEE MTT 43, 544 (1995).

    Article  Google Scholar 

  14. W. Diete et al., Proc. Eur. Conf. Appl. Supercond. SA2.17 (1995).

    Google Scholar 

  15. J. Ceremuga, K. Leong, R. Grabovickic, Proc. MIKON′96, 305 (1996).

  16. S. Y. Lee et al., IEEE Trans. Appl. Supercond. 7, 2013 (1997).

    Article  Google Scholar 

  17. N. Parker et al., IEEE Trans. Appl. Supercond. 9, 1928 (1999).

    Article  Google Scholar 

  18. M. V. Jacob, J. Mazierska, and M. Lorentz, Supercond. Sci. Technol 16, 412 (2003).

    Article  ADS  Google Scholar 

  19. J. Wosik et al., J. Supercond. 10, 97 (1997).

    Google Scholar 

  20. T. Nurgaliev et al., Physica. C 403, 276 (2004)

    Article  ADS  Google Scholar 

  21. R. C. Taber, Rev. Sci. Instrum. 61, 2200 (1990).

    Article  ADS  Google Scholar 

  22. Xiang Ma, PhD Thesis, Stanford University (1995).

  23. H. Piel et al., Physica. C 153, 1604 (1988).

    Article  ADS  Google Scholar 

  24. S. Sridhar and W. L. Kennedy, Rev. Sci Instrum. 49, 531 (1988).

    Article  ADS  Google Scholar 

  25. G. Kuhleman and J. H. Hinken, IEEE Trans. Instrum. Measure. 40, 539 (1991).

    Article  Google Scholar 

  26. IEC web page http://domino.iec.ch/webstore/webstore.nsf/ artnum/028388.

  27. J. Ceremuga, J. Krupka, and T. Kosciuk, J. Supercond. 8, 681 (1995).

    Article  Google Scholar 

  28. J. Mazierska, J. Supercond. 10, 73 (1997).

    Google Scholar 

  29. J. Mazierska and C. Wilker, IEEE Trans. Appl. Superconduc. 11, 4140, (2001).

    Article  Google Scholar 

  30. M. Misra, N. D. Kataria, and G. P. Srivastava, Electron. Lett. 35 1779 (1999)

    Article  Google Scholar 

  31. J. Krupka and J. Mazierska, IEEE Trans. Appl. Supercond. 8, 164 (1998).

    Article  Google Scholar 

  32. J. Mazierska, K. Leong, and M. Jacob, Proc. Asia Pacif. Microwave Conf. 608 (2000)

  33. J. Krupka and J. Mazierska, IEEE Trans. MT&T 48, 1270 (2000).

    Article  Google Scholar 

  34. K. Leong and J. Mazierska, IEEE Trans. MT&T 50, 2115 (2002).

    Article  Google Scholar 

  35. K. Leong and J. Mazierska, J. Supercond. 14, 93( 2001).

    Google Scholar 

  36. B. Utz et al., IEEE Trans. Appl. Supercond. 7, 1272, (1997).

    Article  Google Scholar 

  37. A. Sundaresan et al., Supercond. Sci. Technol. 17 350 (2004).

    Article  ADS  Google Scholar 

  38. Y. Kobayashi, Proc. APMC 2003, TC3-1, (2003).

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Authors and Affiliations

  1. Massey University, Institute of Information Sciences and Technology, Palmerston North, New Zealand

    Janina Mazierska

  2. James Cook University, Electrical and Computer Engineering, Townsville, Australia

    Janina Mazierska & Mohan V. Jacob

Authors
  1. Janina Mazierska
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  2. Mohan V. Jacob
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Mazierska, J., Jacob, M.V. How Accurately Can the Surface Resistance of Various Superconducting Films Be Measured with the Sapphire Hakki–Coleman Dielectric Resonator Technique?. J Supercond 19, 649–655 (2006). https://doi.org/10.1007/s10948-006-0129-z

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  • DOI: https://doi.org/10.1007/s10948-006-0129-z

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