Elsevier

Materials Today Physics

Volume 3, December 2017, Pages 118-126
Materials Today Physics

P-type β-gallium oxide: A new perspective for power and optoelectronic devices

https://doi.org/10.1016/j.mtphys.2017.10.002Get rights and content

Highlights

  • Evidence of p-type conduction in the undoped wide band gap β-Ga2O3.

  • The ionization energy of the acceptor level was measured to be 1.1eV above the valence band edge.

  • p and n type Ga2O3, opens perspective for power and deep UV-optoelectronic devices.

Abstract

Wide-bandgap semiconductors (WBG) are expected to be applied to solid-state lighting and power devices, supporting a future energy-saving society. Here we present evidence of p-type conduction in the undoped WBG β-Ga2O3. Hole conduction, established by Hall and Seebeck measurements, is consistent with findings from photoemission and cathodoluminescence spectroscopies. The ionization energy of the acceptor level was measured to be 1.1eV above the valence band edge. The gallium vacancy was identified as a possible acceptor candidate based on thermodynamic equilibrium Ga2O3 (crystal) – O2 (gas) system calculations (Kroger theory) which revealed a window without oxygen vacancy compensation. The possibility of fabricating large diameter wafers of β-Ga2O3 of p and n type nature, provides new avenues for high power and deep UV-optoelectronic devices.

Graphical abstract

Photograph of a commercial, 2-inch β-Ga2O3/c-sapphire epiwafer from Nanovation; Evidence of p type Ga2O3: Temperature dependence of the Hall hole concentration, ln(p) versus 1000/T plot leading to a carrier activation energy Ea = 0.56 ± 0.05 eV. Valence band photoemission spectra for the reference Si-doped β -Ga2O3/β -Ga2O3 (n-type) and our β - Ga2O3/c-sapphire (p-type).

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Introduction

Ga2O3 has recently attracted considerable interest for its unique combination of material properties [1], [2] and relevance to many present and future application fields: extreme (also referred to as so-called “ultra”) wide bandgap semiconductors (≥4.8 eV) for deep-ultraviolet optoelectronics, very large breakdown electrical field (Ebr = 8 × 106 V cm−1) for high voltage and power electronics. Indeed recent breakthroughs in material quality have led to a “rediscovery” of β-Ga2O3 as an ultra-wide bandgap transparent conductor [3]. Demonstrators include transparent field-effect transistors [4], photodetectors [5], [6], use as a material for microwave and optical maser [7], as well as a material for electroluminescent devices [8] and chemical sensing [9]. Moreover, its very wide bandgap and large disruptive critical electrical field has allowed Ga2O3 to emerge as the fourth generation material platform for power electronics [10], [11], (after silicon, silicon carbide and gallium nitride) [12], [13].

Nevertheless, all the Ga2O3 devices demonstrated thus far are unipolar (only n-type) [2], [14], [15], [16], [17], [18]. In order to realize the full potential for WBG (opto)electronics β-Ga2O3, will need bipolar junction based devices, for which p-type doping will be required. The bipolar junction would be engineered by combining p-type transparent TCOs with either, n-type Ga2O3 or the common n-type ones (namely In2O3, SnO2 and ZnO and its alloys) into transparent p–n heterojunctions in a range of thin-film transistor applications. P-type requirement is also important in the power electronics context, where a high current carrying capability is desirable when considering applications such as grid-level converters. P-type Ga2O3 would allow the definition of Ga2O3 p-n junction building blocks and therefore any traditional Silicon-type devices would be engineered; including metal-oxide-semiconductor transistor field-effect devices (MOSFETs), (complementary) CMOS logic or bipolar devices such as pin diodes or insulator gate bipolar transistors (IGBT).

The current approach to achieve hole conductivity in Ga2O3 devices is by the definition of heterostructures of known p-type semiconductors such as p-type oxides (Ir2O3 [19], NiOx [20]) or acceptor doped semiconductors (Si [21], SiC [22], [23] or graphene [5]), with known disadvantages of crystalline and electronic band structure miss-matches. P doping in Ga2O3 is hugely challenging as an oxide (oxide usually has tendency of formation donor type oxygen vacancies, causing n-type conduction) and as an ultra-wide bandgap material, intrinsic conductivity is rare and even doping (“p” and “n”) is normally not symmetrical. This lack of hole conductivity is probably the main limitation of emerging gallium oxide technology.

Currently, p-type wide bandgap oxides are in the form of binary copper oxides [24]. Cu-based delafosites [25], tin monoxide [26], nickel oxide [27] or layered oxide-chalcogenides [28]. Each of these have a valence band made of eep localized oxygen 2p orbitals, which are responsible for poor hole transport in these materials [29]. Owing to its extreme wide bandgap, doping p-type β-Ga2O3 has been considered practically challenging-if not impossible. Usually nominal undoped as grown β-Ga2O3 single crystals and thin films are generally n-type, because of the existence of unintentional impurities [30], [31]. P-type conductivity was theoretically predicted in gallium oxide by doping group I and II metals from the Mendeleyev table [32], [33].

However, there is no experimental demonstration of this in the literature up to date. Some of the challenges to be overcome in order to realize hole conductivity are [34]:/i/very wide bandgap,/ii/high formation energy of point defects that are hole producers, e.g. native acceptors such as cation vacancies,/iii/small ionization energy for these defects so as to readily release holes, i.e., a shallow acceptor level with respect to the host valence band; and most crucially/iv/low energy of hole killer native defect donors such as cation interstitials and anion vacancies. In particular oxygen vacancies act as compensating donors and both as grown β-Ga2O3 films and bulk crystals are invariably found to be n-type in the literature [30], [31].

This work reveals (via a range of characterization techniques) that intrinsic majority hole conduction can exist and emerge in nominally undoped β-Ga2O3, when compensation by background native donors is reduced.

Section snippets

Material and methods

Commercial pulsed laser deposition grown Ga2O3/c-sapphire epiwafers were provided by Nanovation (www.nanovation.com) [35]. The thickness of the gallium oxide films was around 300 nm, estimated using optical reflection interferometry with an Ocean Optics Nanocalc system. As a reference, n-type sample commercial Si-doped β-Ga2O3 from Novel Crystal Technology, Inc was used in case of photo-spectroscopy study. While for cathodoluminescence measurement we had commercial n-type β-Ga2O3 single crystal

Structural, chemical analyses

Fig. 1a shows a photograph of a 2 inch diameter β-Ga2O3 wafer that has undergone Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM). This characterization showed that the film has a fine granular surface morphology composed of an irregular agglomeration of grains on a tens-of-nm scale. Root Mean Squared roughnesses (RRMS) were in the region of 7 nm (mean of three 1 μm × 1 μm areas) which is similar to other reported values (varying between 3 and 8 nm) for β-Ga2O3 thin films

Conclusion

Attaining this relatively low level of p-type doping in gallium oxide may already be an important step for technological integration. Mainly, in power applications, the p-type conductivity is particularly important as the p-n junction could sustain larger voltages than any Schottky unipolar junction. The ultra-large critical field of Ga2O3 could only seriously be exploited in p-i-n structures [69]. In other words, the demonstration of Ga2O3 bipolarity represents a definitive step forward when

Acknowledgements

We would like to thank NANOVATION (www.nanovation.com) for providing the β-Ga2O3/c-sapphire epiwafers and G.Bouchez for help with optical transmission measurements. APT acknowledges Agencia Estatal de Investigación (AEI) and Fondo Europeo de Desarrollo Regional under contract ENE2015-74275-JIN and ICN2 authors to the Spanish MINECO through the Severo Ochoa Centers of Excellence Program under Grant SEV-2013-0295.

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