Nondestructive full-field imaging XANES-PEEM analysis of cosmic grains

P. Bernhard, J. Maul, T. Berg, F. Wegelin, U. Ott, Ch. Sudek, H. Spiecker, S. Merchel, and G. Schönhense
Phys. Rev. B 74, 075401 – Published 1 August 2006

Abstract

For chemical analysis of submicron particles, mass spectrometric methods have the disadvantage of being destructive. Thus, a nondestructive elemental and chemical mapping with a high spatial resolution prior to mass analysis is extremely valuable to precharacterize the sample. Here, first results are presented of combined XANES (x-ray absorption near-edge structure) and PEEM (photoemission electron microscopy) measurements on a cosmic grain fraction from the Murchison meteorite. This nondestructive full-field imaging method is well suited for a quantitative analysis and for a preselection prior to detailed mass spectrometric investigations with isotopic resolution/selectivity. A spectral unmixing algorithm helped to distinguish between elements in different binding surroundings and therefore to obtain lateral information about the elemental composition and the chemical structure. Individual Al2O3 and SiO2 grains as well as Cr-rich grains could be identified among the majority of SiC grains. This method is suited not only for meteoritic material but can in general be applied to composite grain materials of submicron sizes.

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  • Received 29 March 2006
  • Corrected 4 August 2006

DOI:https://doi.org/10.1103/PhysRevB.74.075401

©2006 American Physical Society

Corrections

4 August 2006

Erratum

Publisher's Note: Nondestructive full-field imaging XANES-PEEM analysis of cosmic grains [Phys. Rev. B 74, 075401 (2006)]

P. Bernhard, J. Maul, T. Berg, F. Wegelin, U. Ott, Ch. Sudek, H. Spiecker, S. Merchel, and G. Schönhense
Phys. Rev. B 74, 079904 (2006)

Authors & Affiliations

P. Bernhard1,*, J. Maul1, T. Berg1, F. Wegelin1, U. Ott2, Ch. Sudek2, H. Spiecker3, S. Merchel4, and G. Schönhense1

  • 1Institut für Physik, Staudingerweg 7, Johannes Gutenberg-Universität, D-55099 Mainz, Germany
  • 2Max-Planck-Institut für Chemie, Becherweg 27, D-55128 Mainz, Germany
  • 3LaVision BioTec GmbH, Meisenstrasse 65, D-33607 Bielefeld, Germany
  • 4CEREGE, UMR CNRS 6635, F-13545 Aix en Provence, France

  • *Corresponding author. Email address: bernharp@uni-mail.de

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Issue

Vol. 74, Iss. 7 — 15 August 2006

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