State Dynamic Modeling using Ionic Conduction Phenomenon for TiO2-based Memristive Thin Film
Raudah Abu Bakar1, Nur Syahirah Kamarozaman2, Wan Fazlida Hanim Abdullah3, and Sukreen Hana Herman4
1Raudah Abu Bakar, NANO-Electronic Centre (NET), Faculty of Electrical Engineering, Universiti Teknologi MARA, Shah Alam, Selangor Darul Ehsan, Malaysia.
2Nur Syahirah Kamarozaman, NANO-Electronic Centre (NET), Faculty of Electrical Engineering, Universiti Teknologi MARA, Shah Alam, Selangor Darul Ehsan, Malaysia.
3Wan Fazlida Hanim Abdullah, Integrated Sensors Research Group, Universiti Teknologi MARA, Shah Alam, Selangor Darul Ehsan, Malaysia.
4Sukreen Hana Herman, Integrated Sensors Research Group, Universiti Teknologi MARA, Shah Alam, Selangor Darul Ehsan, Malaysia.

Manuscript received on November 20, 2019. | Revised Manuscript received on November 28, 2019. | Manuscript published on 30 November, 2019. | PP: 6730-6734 | Volume-8 Issue-4, November 2019. | Retrieval Number: D5213118419/2019©BEIESP | DOI: 10.35940/ijrte.D5213.118419

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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC-BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)

Abstract: In this work a SPICE model was developed for metal-insulator-metal (MIM)-based memristors. The proposed model was achieved by combining the current conduction mechanisms with the dynamical state variable phenomenon. To account for ionic conduction in memristor, the Mott-Gurney law for ion hopping was incorporated in the state variable derivative. As compared to the experimental data, the proposed model is well matched with the measured data. The memristance and root mean square (RMS) error were calculated to be 120 Ω and 0.02 respectively. Simulating the proposed model at frequencies greater than unity formed a smaller hysteresis loop area. Keywords :
Keywords: Titanium Dioxide Thin Film, Resistive Switching, Memristive Behavior, SPICE Model.
Scope of the Article:  Routing, Switching and Addressing Techniques.