Performance Analysis of Dual Edge Triggered Memory Cells using Multiple C-Elements
K.Mariya Priyadarshini1, Sampad Kumar Panda2, R.S. Ernest Ravindran3, S Sarvani4, P Mohan Vinay5, B Suresh Gopi Chand6
1K.Mariya Priyadarshini, Department of Electronics and Communication Engineering, Koneru Lakshmaiah Education Foundation, Vaddeswaram, AP, India.
2R.S. Ernest Ravindran Sampad Kumar Panda, Department of Electronics and Communication Engineering, Koneru Lakshmaiah Education Foundation, Vaddeswaram, AP, India.
3S Sarvani, Department of Electronics and Communication Engineering, Koneru Lakshmaiah Education Foundation, Vaddeswaram, AP, India.
4P Mohan Vinay, Department of Electronics and Communication Engineering, Koneru Lakshmaiah Education Foundation, Vaddeswaram, AP, India.
5B Suresh Gopi Chand, Department of Electronics and Communication Engineering, Koneru Lakshmaiah Education Foundation, Vaddeswaram, AP, India.

Manuscript received on November 12, 2019. | Revised Manuscript received on November 23, 2019. | Manuscript published on 30 November, 2019. | PP: 8604-8607 | Volume-8 Issue-4, November 2019. | Retrieval Number: D7890118419/2019©BEIESP | DOI: 10.35940/ijrte.D7890.118419

Open Access | Ethics and Policies | Cite  | Mendeley | Indexing and Abstracting
© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC-BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)

Abstract: This research paper presents a low conditional discharge(C-element) Flip-Flops that are basic elements in all digital design. The existing circuits are power hunger due to the dynamic and static power dissipation increases. For reducing power consumption C element technique is used to reduce glitches at the data out. Results obtained through 130nm technology shows reduction in energy dissipation and delay. Average dynamic power dissipation of the proposed flip-flop is compare with two existing techniques. Average power of proposed flip-flop is reduced by 28.41% and 36.18% when compared with Latch-Mux flip-flop and Latch-Mux using C-element.
Keywords: Dual Edge Triggering (DET), C-element, Latch-Mux, Flip-Flop.
Scope of the Article: Evaluation of Glazing Systems for Energy Performance.