Abstract
This paper presents a comparative analysis of neural networks, simulated annealing, and genetic algorithms in the determination of input patterns for testing analog circuits. The problem has been modelled as an optimization problem in which the objective is to determine a test signal that maximizes the quadratic difference between the nominal response and the faulty one due to a defect in the circuit. This approach makes possible the search of the test pattern space by using techniques based on neural and evolutive algorithms.
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References
Garey, M.R.; Johnson, D.S.: “Computers and Intractability: A Guide to the Theory of NP-Completeness”. W.H. Freemen and Co, 1979.
“IEEE Standard Test Access Port and Boundary-Scan Architecture” (IEEE Std.1149). IEEE Computer Society (Test Technical Committee), 1990.
Schreiber, H.H.: “Fault Dictionary based upon Stimulus Design”. IEEE Trans. on Circ. and Syst., Vol. CAS-26, No.7, pp. 529–537. July, 1979.
Tsai, S.J.: “Test Vector Generation for Linear Analog Devices”. Proc. Intern. Test Conf., pp.592–597, 1991.
Cooper, L.: “Applied Nonlinear Programming for Engineers and Scientist”. Aloray Publisher, 1974.
Chakradhar, S.T.; Bushnell, M.L.; Agrawal, V.D.: “Toward Massively Parallel Automatic Test Generation”. IEEE Trans. Comp.-Aid. Des., Vol.9, No.9, pp. 981–994. September, 1990.
Krauss, T.P.; Shure, L.; Little, J.N.: “MATLAB: Signal Processing Toolbox User's Guide”. The MathWorks Inc., 1994
Aarts, E.; Korst, J.: “Simulated Annealing and Boltzmann Machines”. John Wiley & Sons, 1990.
Goldberg, D.E.: “Genetic Algorithms in Search, Optimization and Machine Learning”. Addison Wesley, 1989.
Merelo, J.J.: “GAGS 0.94: Users's Manual”. Available at ftp://kal-el.ugr.es/GAGS. 1995.
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© 1995 Springer-Verlag Berlin Heidelberg
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Bernier, J.L., Merelo, J.J., Ortega, J., Prieto, A. (1995). Test pattern generation for analog circuits using neural networks and evolutive algorithms. In: Mira, J., Sandoval, F. (eds) From Natural to Artificial Neural Computation. IWANN 1995. Lecture Notes in Computer Science, vol 930. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-59497-3_258
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DOI: https://doi.org/10.1007/3-540-59497-3_258
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