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Dynamic and Spectroscopic Modes and Multivariate Data Analysis in Piezoresponse Force Microscopy

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Scanning Probe Microscopy of Functional Materials

Abstract

Nonvolatile bias-controlled polarization states in ferroelectric materials offer unique opportunities for information technology and data storage applications. The ability to probe ferroelectric properties at the nanoscale by piezoresponse force microscopy (PFM) has enabled fundamental studies of polarization dynamics and the role of defects and disorder on domain nucleation and wall motion and has led to advances in the design and implementation of such applications. This has resulted in the development of fast spectroscopic modes to collect polarization switching data from every point in an image. The emergence of fast, configurable data processing electronics has prompted the development of dynamic and nonsinusoidal data acquisition methods for PFM. Further, the recent synergy of spectroscopic and dynamic modes has necessitated the development of multivariate data analysis and processing in PFM. These recent advances in the applications of PFM for imaging and spectroscopy of the ferroelectric switching processes will be discussed.

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Acknowledgments

This research was conducted at the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, U.S. Department of Energy. BJR also acknowledges the support of UCD Research. SVK gratefully acknowledges the collaborations with R. Ramesh (UC Berkeley), S. Trolier-McKinstry, V. Gopalan, and L.Q. Chen (Penn State), and A. Morozovska and E. Eliseev (National Academy of Science, Ukraine). The authors also thank A. Gruverman for permission to reproduce data in Fig. 17.10 and Jiangyu Li for the sample imaged in Fig. 17.16. PFM, SS-PFM, BE SPM, and other SPM modes are available as a part of the user program at the Center for Nanophase Materials Sciences (CNMS), www.cnms.ornl.gov.

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  1. University College Dublin, Belfield, Dublin, 4, Ireland

    B. J. Rodriguez

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  1. B. J. Rodriguez
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  2. S. Jesse
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  1. , NanoTransport Laboratory, Oak Ridge National Laboratory, 1 Bethel Valley Road, Oak Ridge, 37831, Tennessee, USA

    Sergei V. Kalinin

  2. Dept. Materials Science and Engineering, Department of Physics & Astronomy, University of Nebraska - Lincoln, 202 Ferguson Hall 7920, Lincoln, 68588, Nebraska, USA

    Alexei Gruverman

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Rodriguez, B.J., Jesse, S., Seal, K., Balke, N., Kalinin, S.V., Proksch, R. (2010). Dynamic and Spectroscopic Modes and Multivariate Data Analysis in Piezoresponse Force Microscopy. In: Kalinin, S., Gruverman, A. (eds) Scanning Probe Microscopy of Functional Materials. Springer, New York, NY. https://doi.org/10.1007/978-1-4419-7167-8_17

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