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Process Variations- and Crosstalk-Aware Pattern Selection

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Test and Diagnosis for Small-Delay Defects

Abstract

The complexity of today’s ICs and shrinking process technologies have made design features more probabilistic. Thus, it is necessary to perform statistical timing analysis when evaluating path lengths and considering process variations. Statistical static timing analysis (SSTA) methods were proposed and SSTA tools were developed to deal with these issues [1, 14]. However, these methods are pattern-independent, i.e., they estimate path length using the delay of components on the path without considering the pattern-dependent parameters. Note that power supply noise and crosstalk are pattern-dependent effects and they can significantly impact the delay of the components on a path.

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Correspondence to Mohammad Tehranipoor .

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Tehranipoor, M., Peng, K., Chakrabarty, K. (2011). Process Variations- and Crosstalk-Aware Pattern Selection. In: Test and Diagnosis for Small-Delay Defects. Springer, New York, NY. https://doi.org/10.1007/978-1-4419-8297-1_4

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  • DOI: https://doi.org/10.1007/978-1-4419-8297-1_4

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