Abstract
Pulsed laser annealing and ion beam mixing are currently being investigated as surface modification techniques in an attempt to enhance the mechanical properties of poly crystalline α-SiC. Thin Ni overlayers (20nm -100nm) are evaporated onto the SiC surface. The specimens are subsequently irradiated with pulses of a ruby or excimer (KrF or XeCl) laser or bombarded with high energy Si+ or Xe+ ions. Following laser irradiation, the fracture strength of the SiC is increased by as much as ≃50%, but after ion beam mixing, no strength increase is observed. Weibull statistics are used to characterize the SiC fracture strength data before and after surface modification. Cross-sectional transmission electron microscopy (X-TEM), scanning electron microscopy (SEM), secondary ion mass spectroscopy (SIMS), and Rutherford backs cattering (RBS) techniques are used to characterize the modified SiC in order to determine the cause for the increase in fracture strength and the extent of mixing as a result of the surface modification.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
S. D. Ferris, H. J. Leamy, and J. M. Poate, eds., Laser-Solid Interactions and Laser Processing —. 1978, American Institute of Physics, No. 50 (1979).
C. W. White and P. S. Peercy, eds., Laser and Electron Beam Processing of Materials, Academic Press, New York (1980).
B. R. Appleton, J, Materials for Energy Systems, 6(3), 1984, p. 200–11.
B. R. Appleton in: Ion Implantation and Beam Processing, J. S. Williams and J. M. Poate, eds., Academic Press, New York (1984).
J. M. Poate and J. W. Mayer, eds., Laser Annealing of Semiconductors, Academic Press, New York (1984).
J. W. Mayer, B. Y. Tsaur, S. S. Lau, and L. S. Hung, Nucl. Inst, and Meth., 182/183, 1981, p. 1–13.
B. Y. Tsaur, Z. L. Liau, and J. W. Mayer, Appl. Phys. Lett., 34(2), 1979.
G. C. Farlow, B. R. Appleton, L. A. Boatner, C. J. McHargue, C. W. White, G. J. Clarke, and J. E. E. Baglin, Presented at the Fall Meeting of the Materials Research Society, San Fransisco, CA (1984).
C. W. White, G. Farlow, J. Narayan, G. J. Clarke, and J. E. E. Baglin, Materials Letters, 2(5A), 1984, p. 367–72.
J. Narayan, D. Fathy, O. W. Holland, B. R. Appleton, R. F. Davis, and P. F. Becher, J. Appl. Phys., 56(6), 1984, p. 1577–82.
D. Fathy, J. Narayan, O. W. Holland, B. R. Appleton, and R. F. Davis, Materials Letters, 2(4B), 1984, p. 324–7.
D. Fathy, O. W. Holland, J. Narayan, and B. R. Appleton, Nucl. Inst. Meth., B 7/8, 1985, p. 571–5.
C. J. McHargue, G. C. Farlow, C. W. White, J. M. Williams, B. R. Appleton, and H. Naramoto, Mat. Sci. and Eng., 69, 1985, p. 123–7.
B. R. Appleton, H. Naramoto, C. W. White, O. W. Holland, C. J. McHargue, G. Farlow, J. Narayan, and J. M. Williams, Nucl. Inst. Meth., B1, 1984, p. 167–75.
E. H. Kraft and J. A. Coppola, Presented at the Fifth Army Materials Technology Conference Ceramics for High Performance Applications — II, March 25, 1977, Newport, RI.
S. G. Seshadri and M. Srinivasan, J. of Eng. Mat. and Tech., 105, 1983, p. 219–23.
H. P. Kirchner and R. M. Gruver in: Fracture Mechanics of Ceramics 3 Vol. 1, R. C. Bradt, D. P. H. Hasselman, and F. F. Lange, eds., Plenum Press, New York (1973).
Roy W. Rice in: Reference 17.
Roy W. Rice in: Fractography of Ceramic and Metal Failures, J. J. Mecholsky and S. R. Powell, eds., ASTM STP827, Baltimore (1984).
D. B. Marshall, B. R. Lawn, and J. J. Mecholsky, J. Amer. Cer. Soc., 63(5–6), 1980, p. 358–60.
K. L. More and J. J. Mecholsky, to be published.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1986 Plenum Press, New York
About this chapter
Cite this chapter
More, K.L., Davis, R.F. (1986). Observed Changes in Fracture Strength Following Laser Irradiation and Ion Beam Mixing of Ni Overlayers on Sintered Alpha-SiC. In: Bradt, R.C., Evans, A.G., Hasselman, D.P.H., Lange, F.F. (eds) Fracture Mechanics of Ceramics. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-7026-4_19
Download citation
DOI: https://doi.org/10.1007/978-1-4615-7026-4_19
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4615-7028-8
Online ISBN: 978-1-4615-7026-4
eBook Packages: Springer Book Archive