Abstract
Given our experience with the digital test problem and the analog computer- aided design (CAD) problem, one might initially assume that the analog test problem could be resolved simply by integrating the tools and techniques of these two well-established fields. In fact, however, the analog problem is characterized by tolerance, modeling, and simulation problems which have no counterpart in the digital problem, while many of the concepts derived from the analog design problem are incompatible with the economics of the test environment.
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© 1991 Van Nostrand Reinhold
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Wey, CL. (1991). A Searching Approach Self-Testing Algorithm for Analog Fault Diagnosis. In: Liu, Rw. (eds) Testing and Diagnosis of Analog Circuits and Systems. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-9747-6_6
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DOI: https://doi.org/10.1007/978-1-4615-9747-6_6
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