Abstract
Ultrasonic pulses, generated by thermoelastic effects and ablation in an opaque coupling layer deposited on the sample surface, are utilized to nondestructively determine charge, polarization and piezoelectricity profiles in thin dielectric films with a resolution of 1 to 2 μm. The method utilizes a 70 ps laser light pulse to launch a less than 500 ps long pressure pulse in the sample. Propagation of the laser-induced pressure pulse (LIPP) through the film causes electrode currents which directly yield the distributions. Results for charge profiles in Teflon FEP and piezoelectricity profiles in PVDF are described. The LIPP method has also been used to measure ultrasonic velocity and attenuation up to 1 GHz in various biased or surface charged polymer films.
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Sessler, G.M., Gerhard-Multhaupt, R., West, J.E., Berraissoul, A. (1987). Nondestructive High-Resolution Measurement of Charge, Polarization and Piezoelectricity Distributions in Thin Dielectric Films. In: Bussière, J.F., Monchalin, JP., Ruud, C.O., Green, R.E. (eds) Nondestructive Characterization of Materials II. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-5338-6_39
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DOI: https://doi.org/10.1007/978-1-4684-5338-6_39
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