Abstract
This paper proposes representing and detecting manufacturing defects at the micrometre scale using deep convolutional neural networks. The information theoretic notion of entropy is used to quantify the information gain or mutual information of filters throughout the network, where the deepest network layers are generally shown to exhibit the highest mutual information between filter responses and defects, and thus serve as the most discriminative features. Quantitative detection experiments based on the AlexNet architecture investigate a variety of design parameters pertaining to data preprocessing and network architecture, where the optimal architectures achieve an average accuracy of 98.54%. CNNs are relatively easy to perform and give impressive achievements in classification tasks. However, the informational complexity coming from the depth of networks represents a limit to improve their capabilities.
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Notes
- 1.
It should be noted that the term texture in the context of materials science, almost always refers to crystallographic texture, i.e., the dominant crystallographic orientation of a set of grains, and in some cases to the morphological texture. Consequently, this confusion may not help the diffusion of texture analysis in the materials science and engineering community.
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Boyadjian, Q., Vanderesse, N., Toews, M., Bocher, P. (2020). Detecting Defects in Materials Using Deep Convolutional Neural Networks. In: Campilho, A., Karray, F., Wang, Z. (eds) Image Analysis and Recognition. ICIAR 2020. Lecture Notes in Computer Science(), vol 12131. Springer, Cham. https://doi.org/10.1007/978-3-030-50347-5_26
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