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Fatigue Damage Identification and Remaining Useful Life Estimation of Composite Structures Using Piezo Wafer Active Transducers

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Advances in Asset Management and Condition Monitoring

Part of the book series: Smart Innovation, Systems and Technologies ((SIST,volume 166))

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Abstract

The prediction of fatigue damage accumulation is a crucial element in the estimation of the Remaining Useful Life of composite structures subjected to cyclic loading. In this paper, two Glass-Fibre Reinforced Plastics, a thin strip and a thick beam, are subjected to fatigue load while being monitored with Piezo Wafer Active Sensors. Two distinct methods, one based on Electro-Mechanical Impedance Spectroscopy (EMIS) and one based on the Reconstruction Algorithm for Probabilistic Identification of Damage (RAPID), are employed. Both methods are mostly used for damage detection, yet not for damage accumulation monitoring. The results presented in this paper show that damage accumulation can be followed during fatigue loading of the test objects. The trends shown in the damage accumulation graphs give an indication of the damage accumulation, and even a change in the damage evolution stage, yet a complete RUL estimation is not possible without further analysis of the experiments, possibly assisted by numerical modelling.

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Ackowledgements

The work presented is funded by the Dutch TKI Wind at Sea project SLOWIND, grant number TEWZ 115012. This support is gratefully acknowledged by the authors.

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Authors and Affiliations

  1. Dynamics Based Maintenance, University of Twente, P.O. Box 217, 7500AE, Enschede, The Netherlands

    Richard Loendersloot

  2. Mechatronics Laboratory, New Technologies Research Center (NTRC), Amirkabir University of Technology, Tehran, Iran

    Mohammad Ehsani & Mahnaz Shamshirsaz

Authors
  1. Richard Loendersloot
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  2. Mohammad Ehsani
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  3. Mahnaz Shamshirsaz
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Corresponding author

Correspondence to Richard Loendersloot .

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Editors and Affiliations

  1. University of Huddersfield, Huddersfield, UK

    Andrew Ball

  2. University of Huddersfield, Huddersfield, UK

    Len Gelman

  3. COMADEM International, Birmingham, UK

    B. K. N. Rao

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Loendersloot, R., Ehsani, M., Shamshirsaz, M. (2020). Fatigue Damage Identification and Remaining Useful Life Estimation of Composite Structures Using Piezo Wafer Active Transducers. In: Ball, A., Gelman, L., Rao, B. (eds) Advances in Asset Management and Condition Monitoring. Smart Innovation, Systems and Technologies, vol 166. Springer, Cham. https://doi.org/10.1007/978-3-030-57745-2_41

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  • DOI: https://doi.org/10.1007/978-3-030-57745-2_41

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-57744-5

  • Online ISBN: 978-3-030-57745-2

  • eBook Packages: EngineeringEngineering (R0)

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