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Probing Perovskite Interfaces and Superlattices with X-ray Photoemission Spectroscopy

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Hard X-ray Photoelectron Spectroscopy (HAXPES)

Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 59))

Abstract

The use of X-ray photoemission spectroscopy (XPS) in the soft, intermediate and hard X-ray regimes in probing complex oxide interfaces and superlattices is reviewed. Core-level line shapes are briefly discussed, followed by a case study of several aspects of the LaAlO3/SrTiO3(001) heterojunction. These include how XPS in both angle-integrated and angle-resolvedĀ modes has been used to probe the physical cause of interface conductivity, the origin of itinerant electrons, the valence band offset, and the extent of cation mixing. The chapter concludes with a brief discussion of other perovskite interfaces which have been successfully investigated with XPS.

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Acknowledgements

The author is indebted to Tiffany Kaspar and Ryan Comes for critical readings of this manuscript, and Joe Woicik, Susanne Stemmer, Ralph Claessen and Michael Sing for helpful comments. The writing of this chapter was supported by the U.S. Department of Energy, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering under Award #10122, and Chemical Sciences, Geosciences and Biosciences Division under Award #48526. Some of the work described in this review was conducted in the William R. Wiley Environmental Molecular Sciences Laboratory (EMSL), a national scientific user facility sponsored by DOEā€™s Office of Biological and Environmental Research and located at PNNL. PNNL is operated by Battelle for the DOE under Contract DE-AC05-76RLO1830.

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Chambers, S.A. (2016). Probing Perovskite Interfaces and Superlattices with X-ray Photoemission Spectroscopy. In: Woicik, J. (eds) Hard X-ray Photoelectron Spectroscopy (HAXPES). Springer Series in Surface Sciences, vol 59. Springer, Cham. https://doi.org/10.1007/978-3-319-24043-5_14

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