Abstract
This chapter presents a multiport empirical model for I/O memory interface (e.g. inverter) designed based on fully depleted silicon on isolator (FDSOI) CMOS 28 nm process for signal and power integrity assessments. The analog mixed-signal identification signals that carry the information about I/O interface are recorded from large signal simulation setup. The model’s functions are extracted based on a nonlinear optimization algorithm and then implemented in Simulink software. The performance of the resulted model is validated in typical power and ground switching noise scenario. The developed empirical model accurately predicts the timing signal waveforms at the power, ground, and at the output port. Moreover, a comparative analysis between the artificial neural networks (ANNs) and adaptive neuro-fuzzy inference (ANFIS) models by exploring their modelling capabilities regarding the mathematical structures and identification algorithms in providing an accurate and computational effective behavioral model for the I/O buffers nonlinear dynamic behavior is investigated. The proposed model of the two-port I/O buffer is extracted from observable large-signal I/O current and voltages transient data. The training and computational performances along with the prediction accuracy of both modelling approaches are evaluated. The ANFIS model has better prediction accuracy by improving the normalized mean squared error (NMSE) by −13.5 dB while reducing by 11.66% the parameters’ number in cross-validation signal integrity scenario.
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Dghais, W., Cunha, T. R., & Pedro, J. C. (2013, October). A novel two-port behavioral model for I/O buffer overclocking simulation. IEEE Transactions on Components, Packaging and Manufacturing Technology, 3(10), 1754–1763.
Nadezhin, D., Gavrilov, S., Glebov, A., Egorov, Y., Zolotov, V., & Blaauw, D (2003, November). SOI transistor model for fast transient simulation, In Proceedings of the IEEE/ACM international conference on Computer-aided design (pp. 120–128).
Dghais, W., & Rodriguez, J. (2015, March). Empirical modelling of FDSOI CMOS inverter for signal/power integrity simulation. In IEEE conference Design Automation and Test in Europe, Grenoble, France.
Rossi, D., Steiner, C., & Metra, C. (2006). Analysis of the impact of bus implemented EDCs on on-chip SSN (pp. 59–64). Europe: Design Automation and Test.
Dghais, W., & Rodriguez, J. (2015, May). IBIS model formulation and extraction for SPI evaluation. In IEEE workshop on signal and power integrity (SPI), Berlin, Germany.
IBIS Modeling Cookbook (2008). [online] Available: http://www.vhdl.org/pub/ibis/cookbook/cookbook-v4.pdf
Knoth, C., Jedda, H., & Schlichtmann, U. (2012). Current source modeling for power and timing analysis at different supply voltages (pp. 923–928). Automation and Test in Europe: Design.
Stievano, I. S., Maio, I. A., & Canavero, F. G. (2004). Mπlog macromodeling via parametric identification of logic gates. IEEE Transactions on Advanced Packaging, 27(1), 15–23.
Dghais, W., Cunha, T. R., & Pedro, J. C. (2012). Reduced-order parametric behavioral model for digital buffers/drivers with physical support. IEEE Transactions on Components, Packaging and Manufacturing Technology, 2(12), 1–10.
Wood, J., Root, D. E., & Tuffilaro, N. B. (2004). A behavioral modeling approach to nonlinear model-order reduction for RF/microwave ICs and systems. IEEE Transactions on Microwave Theory and Techniques, 52(9), 2274–2284.
Dghais, W., & Rodriguez, J. (2016). New Multiport I/O Model for Power-Aware Signal Integrity Analysis. IEEE Transactions on Components, Packaging and Manufacturing Technology, 6(3), 447–454.
Diouf, C., Telescu, M., Tanguy, N., Stievano, I. S., & Canavero, F. G. (2016, May). Robust nonlinear models for CMOS buffers. In IEEE 20th Workshop on Signal and Power Integrity (SPI), Torino, I, (pp. 1–4).
Dghais, W., Cunha, T. R., & Pedro, J. C. (2013, October). A novel two-port behavioral model for I/O buffer overclocking simulation. IEEE Transactions on Components, Packaging and Manufacturing Technology, 3(10), 1754–1763.
Sjöberg, J., Zhang, Q., Ljung, L., Benveniste, A., Delyon, B., Glorennec, P.-Y., et al. (1995). Nonlinear Black-Box Modeling in System Identification: a Unified Overview. Automatica, 31(12), 1691–1724.
Babuka, R., & Verbruggen, H. (2003). Neuro-Fuzzy Methods for Nonlinear System Identification. Annual. Rev. Control, 27, 73–85.
Kayacan, E., & Khanesar, M. A. (2015). “Identification of Nonlinear Dynamic Systems Using Type-2 Fuzzy Neural Networks—A Novel Learning Algorithm and a Comparative Study”. IEEE Transactions on Industrial Electronics, 62, 1716–1724.
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Dghais, W., Chen, Y. (2018). Neuro-Fuzzy Nonlinear Dynamic Modelling for Signal Integrity Simulation. In: Alam, M., Dghais, W., Chen, Y. (eds) Real-Time Modelling and Processing for Communication Systems. Lecture Notes in Networks and Systems, vol 29. Springer, Cham. https://doi.org/10.1007/978-3-319-72215-3_4
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DOI: https://doi.org/10.1007/978-3-319-72215-3_4
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