Abstract
Post-production test or simply test is the process of sorting out defective chips from the proper ones after fabrication. This chapter examines the impact of approximations in post-production test and proposes test methodologies that have the potential for significant yield improvement. To the best of our knowledge, this is the first systematic approach considering the impact of design level approximations in post-production test.
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Notes
- 1.
Note: The approximation-aware test feature for the aXc tool is proprietary and not publicly available.
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Chandrasekharan, A., Große, D., Drechsler, R. (2019). Post-Production Test Strategies for Approximation Circuits. In: Design Automation Techniques for Approximation Circuits. Springer, Cham. https://doi.org/10.1007/978-3-319-98965-5_6
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DOI: https://doi.org/10.1007/978-3-319-98965-5_6
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