Abstract
The multipurpose spectrometer for nondestructive, depth selective investigation of physical and chemical properties of a surface and bulk is described. It realizes opportunities of Mössbauer and X-ray Fluorescence Spectroscopy in normal and TERconditions, Mössbauer and X-ray diffractometry and also Mossbauer and X-ray Reflectometry. Some analytical characteristics and capabilities of a spectrometer are illustrated as an example of research with a model sample.
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Irkaev, S.M., Semenov, V.G., Panchuk, V.V., Makarov, N.A. (2006). Multipurpose spectrometer TERLAB for depth selective investigation of surface and multilayer. In: Lippens, PE., Jumas, JC., Génin, JM.R. (eds) ICAME 2005. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-49853-7_26
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DOI: https://doi.org/10.1007/978-3-540-49853-7_26
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Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-49852-0
Online ISBN: 978-3-540-49853-7
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