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Frequency Modulation Atomic Force Microscopy in Liquids

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Applied Scanning Probe Methods VIII

Part of the book series: Nano Science and Technolgy ((NANO))

Abstract

Frequency modulation atomic force microscopy is a sensitive and quantitative dynamic technique, which utilizes the change in resonance frequency of a cantilever to detect variations in the interaction force between the cantilever tip and the sample of interest. Although it has been used extensively in ultrahigh vacuum, it is rarely used in liquids. Here we explore the application of the technique in the liquid environment, covering various experimental implementations of the technique and its theoretical foundations. In addition, we describe a number of applications that demonstrate the potential of the technique in liquids and highlight future prospects

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Author information

Authors and Affiliations

  1. Conway Institute of Biomolecular and Biomedical Research, University College Dublin, Belfield, Dublin 4, Ireland

    Suzanne P. Jarvis

  2. Department of Mathematics and Statistics, The University of Melbourne, 3010, Victoria , Australia

    John E. Sader

  3. Department of Physics, Kanazawa University, 920-1192, Kakuma-machi, Kanazawa, Japan

    Takeshi Fukuma

Authors
  1. Suzanne P. Jarvis
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  2. John E. Sader
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  3. Takeshi Fukuma
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Editor information

Editors and Affiliations

  1. Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), The Ohio State University, W390 Scott Laboratory, 201W. 19th Avenue, 43210-1142, Columbus, Ohio, USA

    Bharat Bhushan

  2. Institute of Physics, FB 16, University of Münster, Wilhelm-Klemm-Str. 10, 48149, Münster, Germany

    Harald Fuchs

  3. Advanced Institute of Science & Technology, School of Materials Science, 923-1292, Ishikawa, Japan

    Masahiko Tomitori

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Jarvis, S., Sader, J., Fukuma, T. (2008). Frequency Modulation Atomic Force Microscopy in Liquids. In: Bhushan, B., Fuchs, H., Tomitori, M. (eds) Applied Scanning Probe Methods VIII. Nano Science and Technolgy. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-74080-3_9

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