Skip to main content

Overcoming Non-determinism in Testing Smart Devices: A Case Study

  • Conference paper
Computer Safety, Reliability, and Security (SAFECOMP 2010)

Part of the book series: Lecture Notes in Computer Science ((LNPSE,volume 6351))

Included in the following conference series:

Abstract

This paper presents a case study in ”black-box” assessment of a ”smart” device where, based only on the user manuals and the instrument itself, we try to build confidence in smart device reliability. To perform the black-box assessment, we developed a test environment which automates the generation of test data, their execution and interpretation of the results. The assessment was made more complex by the inherent non-determinism of the device. For example, non-determinism can arise due to inaccuracy in an analogue measurement made by the device when two alternative actions are possible depending on the measured value. This non-determinism makes it difficult to predict the output values that are expected from a test sequence of analogue input values. The paper presents two approaches to dealing with this difficulty: (1) based on avoidance of test values that could have multiple responses, (2) based on consideration of all possible interpretations of input data. To support the second approach we use advanced modelling and simulation techniques to predict all the likely interpretations and check whether any of them is observed at the smart device output.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Bishop, P., Bloomfield, R., Guerra, S., Tourlas, K.: Justification of Smart Sensors for Nuclear Applications. In: Winther, R., Gran, B.A., Dahll, G. (eds.) SAFECOMP 2005. LNCS, vol. 3688, pp. 194–207. Springer, Heidelberg (2005)

    Chapter  Google Scholar 

  2. Alur, R., Henzinger, T.: A Really Temporal Logic. Journal of the ACM (JACM) 41(1), 181–203 (1994)

    Article  MATH  MathSciNet  Google Scholar 

  3. National Instruments, LabVIEW, http://www.ni.com/labview (visited on 24/02/2010)

  4. Krichen, M., Tripakis, S.: Black-Box Conformance Testing for Real-Time Systems. In: Graf, S., Mounier, L. (eds.) SPIN 2004. LNCS, vol. 2989, pp. 109–126. Springer, Heidelberg (2004)

    Chapter  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2010 Springer-Verlag Berlin Heidelberg

About this paper

Cite this paper

Bishop, P., Cyra, L. (2010). Overcoming Non-determinism in Testing Smart Devices: A Case Study. In: Schoitsch, E. (eds) Computer Safety, Reliability, and Security. SAFECOMP 2010. Lecture Notes in Computer Science, vol 6351. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-15651-9_18

Download citation

  • DOI: https://doi.org/10.1007/978-3-642-15651-9_18

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-15650-2

  • Online ISBN: 978-3-642-15651-9

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics