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Low Energy Ion Scattering and Recoiling Spectroscopy in Surface Science

  • Chapter
Surface Science Techniques

Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 51))

Abstract

This chapter presents an overview of low energy ion scattering spectroscopy and time of flight scattering and recoiling spectroscopy for the study of the structure and composition of surfaces as well as of fundamental ion surface interaction processes. The emphasis is on basic concepts regarding scattering, energy losses and charge transfer phenomena and experimental aspects involved in measurements of ion energies and time of flight measurements of scattered atoms. Some examples are provided to illustrate the type of information that can be obtained.

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Acknowledgements

The author would like to thank Dr. Gianangelo Bracco and Dr. Jorge Valdes for comments on the manuscript.

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  1. Institut des Sciences Moléculaires d’Orsay, CNRS and Université Paris-Sud, UMR 8214, Bâtiment 351, 91405, Orsay Cedex, France

    Vladimir A. Esaulov

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  1. , Department of Physics, University of Genoa, Via Dodecaneso 33, Genoa, 16146, Italy

    Gianangelo Bracco

  2. , Department of Physics and Technology, University of Bergen, Allegaten 55, Bergen, 5007, Svalbard

    Bodil Holst

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Esaulov, V.A. (2013). Low Energy Ion Scattering and Recoiling Spectroscopy in Surface Science. In: Bracco, G., Holst, B. (eds) Surface Science Techniques. Springer Series in Surface Sciences, vol 51. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-34243-1_15

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