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Effect of Intermediate Range Order on the Lineshape of the Ge K Edge

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EXAFS and Near Edge Structure III

Part of the book series: Springer Proceedings in Physics ((SPPHY,volume 2))

Abstract

EXAFS investigations on a-Ge [1–3] deposited at different temperatures pointed to the nucleation of ordered grains in the amorphous matrix, whose size increases with temperature. This process was revealed by important modifications of the EXAFS spectrum, Χ(k), and consequently of its Fourier transform. Besides these modifications in the EXAFS part of the spectrum, significant changes in the shape of the near edge structure (XANES) occur which should be correlated to the structural evolution of the system. It is the purpose of this paper to show that this is indeed the case and that a careful analysis of the near edge structure (associated with a calculation of the absorption cross section) can elucidate the relation between fluctuations of bond distances and edge shape.

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© 1984 Springer-Verlag Berlin Heidelberg

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Proietti, M.G., Mobilio, S., Gargano, A., Incoccia, L., Evangelisti, F. (1984). Effect of Intermediate Range Order on the Lineshape of the Ge K Edge. In: Hodgson, K.O., Hedman, B., Penner-Hahn, J.E. (eds) EXAFS and Near Edge Structure III. Springer Proceedings in Physics, vol 2. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-46522-2_7

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  • DOI: https://doi.org/10.1007/978-3-642-46522-2_7

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-46524-6

  • Online ISBN: 978-3-642-46522-2

  • eBook Packages: Springer Book Archive

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