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Table of contents (9 chapters)
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Bibliographic Information
Book Title: Point Defects in Semiconductors II
Book Subtitle: Experimental Aspects
Authors: Jacques Bourgoin, Michel Lannoo
Series Title: Springer Series in Solid-State Sciences
DOI: https://doi.org/10.1007/978-3-642-81832-5
Publisher: Springer Berlin, Heidelberg
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eBook Packages: Springer Book Archive
Copyright Information: Springer-Verlag Berlin Heidelberg 1983
Softcover ISBN: 978-3-642-81834-9Published: 08 December 2011
eBook ISBN: 978-3-642-81832-5Published: 06 December 2012
Series ISSN: 0171-1873
Series E-ISSN: 2197-4179
Edition Number: 1
Number of Pages: XVI, 295