Abstract
A Bayesian approach to reliability demonstration testing is described and differences between the Bayesian viewpoint and the commonly employed classical approach are highlighted. A procedure for selecting a specific inverted gamma probability density to characterize the prior distribution of the MTBF of electronic hardware is developed and a table of Bayesian demonstration plans for a practical range of input parameters is provided. In addition, procedures for implementation of the plans and two illustrative examples are given. Finally, two commonly employed classical plans are compared to a Bayesian plan illustrating the efficiency of the latter in terms of demonstration test time requirements.
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© 1972 Physica-Verlag, Rudolf Liebing KG, Würzburg
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Schick, G.J., Drnas, T.M. (1972). Bayesian Reliability Demonstration. In: Henke, M., Jaeger, A., Wartmann, R., Zimmermann, HJ. (eds) DGU. Proceedings in Operations Research, vol 1971. Physica-Verlag HD. https://doi.org/10.1007/978-3-642-99745-7_8
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DOI: https://doi.org/10.1007/978-3-642-99745-7_8
Publisher Name: Physica-Verlag HD
Print ISBN: 978-3-7908-0119-4
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