Skip to main content

A Hybrid Monitor Assisted Fault Injection Environment

  • Conference paper
Dependable Computing for Critical Applications 3

Part of the book series: Dependable Computing and Fault-Tolerant Systems ((DEPENDABLECOMP,volume 8))

Abstract

This paper describes a hybrid (hardware/software monitor) fault injection environment and its application to a commercial fault tolerant system. The hybrid environment is useful for obtaining dependability statistics and failure characteristics for a range of system components. The Software instrumentation keeps the introduced overhead small so that error propagation and control flow are not significantly affected by its presence. The Hybrid environment can be used to obtain precise measurements of instruction-level activity that would otherwise be impossible to perform with a hardware monitor alone. It is also well suited for measuring extremely short error latencies. Its utility is demonstrated by applying it to the study of a Tandem Integrity S2 system. Faults are injected into CPU registers, cache, and local memory. The effects of faults on individual user applications are studied by obtaining subsystem dependability measurements such as detection and latency statistics for cache and local memory. Instruction-level error propagation effects are also measured.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. R. Chillarege, R. K. Iyer. Measurement-Based Analysis of Error Latency. IEEE Trans Computers, vol. C-36, No.5., May 1987, pp. 529–537.

    Article  Google Scholar 

  2. R. Chillarege, N. S. Bowen. Understanding large system failures — A fault injection experiment. Proc. 19th International Symposium on Fault-Tolerant Computing, June 1989, pp. 355-363.

    Google Scholar 

  3. G. Choi, R. K. Iyer, V. A. Carreno. Simulated Fault Injection: A Methodology to Evaluate Fault Tolerant Microprocessor Architectures. IEEE Transactions on Reliability-Special Issue on Experimental Evaluation, Vol. 39, No. 4, October 1990, pp. 486–491.

    Article  Google Scholar 

  4. G. S. Choi, R. K. Iyer, V. Carreno. FOCUS: An Experimental Environment for Fault Sensitivity Analysis. To appear in IEEE Transactions on Computers.

    Google Scholar 

  5. E. Czeck. On the Prediction of Fault Behavior based on Workload. PhD. dissertation, Electrical and Computer Engineering Department, Carnegie Mellon University, Pittsburgh, PA, April 19, 1992.

    Google Scholar 

  6. K. Goswami, R. Iyer. A Simulation-Based Study of a Triple Modular Redundant System using DEPEND. Proc. 5th International FTRS Conference, Nurnberg, Germany, Sept. 25–27, 1991.

    Google Scholar 

  7. D. Jewett. Integrity S2: A Fault-Tolerant Unix Platform. Proc. 21st International Symposium on Fault-Tolerant Computing, Montreal, June 25–27, 1991, pp. 512-519.

    Google Scholar 

  8. G. Kanawati, N. Kanawati, J. Abraham. FERRARI: A Fault and ERRor Automatic Realtime Injector. Proc. 22nd International Symposium on Fault-Tolerant Computing, Boston, 1992.

    Google Scholar 

  9. J. H. Lala. Fault detection, isolation and reconfiguration in FTMP: Methods and experimental results. Proc. 5th Avionics Systems Conference, Seattle, WA, Nov. 1983, pp. 21.3.1-21.3.9.

    Google Scholar 

  10. J. C. Laprie. Dependable Computing and Fault-Tolerance: Concepts and Terminology. Proc. 15th International Symposium on Fault-Tolerant Computing, Ann Arbor, MI, USA, June 1985, pp. 2-11.

    Google Scholar 

  11. D. Lomelino, R. Iyer. Error propagation in a digital avionic processor: A simulation-based study. NASA CR-176501, University of Illinois, 1986.

    Google Scholar 

  12. J. G. McGough, F. L. Swern, S. Bavuso. New results in fault latency modeling. Proc. IEEE EASCON Conf., Washington, D.C., Aug. 1983, pp. 882-889.

    Google Scholar 

  13. S. G. Mitra, R. K. Iyer. Measurement-based Analysis of Multiple Latent Errors and Near-coincident Fault Discovery in a Shared Memory Multiprocessor. Proc. 1988 International Conference on Parallel Processing, St. Charles, IL, August 15–19, 1988, pp. 404-409.

    Google Scholar 

  14. Z. Segall, D. Vrsalovic, et al. FIAT — Fault Injection Based Automated Testing Environment. Proc. 18th International Symposium on Fault-Tolerant Computing, 1988, pp. 102-107.

    Google Scholar 

  15. K. G. Shin, Y. H. Lee. Measurement and Application of Fault Latency. IEEE Trans. Computers, Vol. C-35, No. 4., April 1986, pp. 307–375.

    Article  Google Scholar 

  16. DAS 9200 92A60/90 User’s Manual (8-/16-/32-Bit Microprocessor Support Modules). Tektronix, Inc., Beaverton, OR, May 1988.

    Google Scholar 

  17. L. Young, R. Iyer. Error Latency Measurements in Symbolic Architectures. Proc. AIAA Computing in Aerospace 8, Baltimore, Maryland, October 22–24, 1991, pp. 786-794.

    Google Scholar 

  18. C. Yount, D. Siewiorek. Automatic Generation of Instruction-Level Error Manifestations of Hardware Failures. (pending technical report), Center for Dependable Systems, Dept. of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA, 1992.

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 1993 Springer-Verlag Wien

About this paper

Cite this paper

Young, L.T., Alonso, C., Iyer, R.K., Goswami, K.K. (1993). A Hybrid Monitor Assisted Fault Injection Environment. In: Landwehr, C.E., Randell, B., Simoncini, L. (eds) Dependable Computing for Critical Applications 3. Dependable Computing and Fault-Tolerant Systems, vol 8. Springer, Vienna. https://doi.org/10.1007/978-3-7091-4009-3_12

Download citation

  • DOI: https://doi.org/10.1007/978-3-7091-4009-3_12

  • Publisher Name: Springer, Vienna

  • Print ISBN: 978-3-7091-4011-6

  • Online ISBN: 978-3-7091-4009-3

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics