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Logic Verification, Testing and their Relationship to Logic Synthesis

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Testing and Diagnosis of VLSI and ULSI

Part of the book series: NATO ASI Series ((NSSE,volume 151))

Abstract

Much work has gone into automating the integrated circuit (IC) design process over the past few years (e.g. [1] [2] [3]). A variety of Computer-Aided Design (CAD) tools for the logic [4] [5] and physical design [6] of integrated circuits have been developed. It is clear that an integrated set of computer design aids coupled with an unified approach to data management is essential for VLSI design. To this end, research has focused on IC synthesis systems [7] i.e. systems which can automatically generate functionally correct mask-level layout of integrated circuit chips from high level, programming language-like specifications.

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Author information

Authors and Affiliations

  1. Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, 94720, USA

    Srinivas Devadas, Hi-Keung Tony Ma & Alberto Sangiovanni-Vincentelli

Authors
  1. Srinivas Devadas
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  2. Hi-Keung Tony Ma
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  3. Alberto Sangiovanni-Vincentelli
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Editor information

Editors and Affiliations

  1. Department of Electrical and Computer Engineering, University of Colorado at Boulder, Boulder, Colorado, USA

    Fabrizio Lombardi

  2. Department of Computer Science, Texas A&M University, College Station, Texas, USA

    Fabrizio Lombardi

  3. Dipartimento di Electtronica, Politecnico di Milano, Milano, Italy

    Mariagiovanna Sami

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© 1988 Kluwer Academic Publishers

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Devadas, S., Ma, HK.T., Sangiovanni-Vincentelli, A. (1988). Logic Verification, Testing and their Relationship to Logic Synthesis. In: Lombardi, F., Sami, M. (eds) Testing and Diagnosis of VLSI and ULSI. NATO ASI Series, vol 151. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-1417-9_8

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  • DOI: https://doi.org/10.1007/978-94-009-1417-9_8

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-7134-5

  • Online ISBN: 978-94-009-1417-9

  • eBook Packages: Springer Book Archive

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