Abstract
In this work, parasitic series resistance (Rs) has been computed for IMPATT using 4H-SiC and diamond at Ku band. Rs is calculated from the conductance- susceptance profile of the IMPATT. Rs of 4H-SiC was found to be less than diamond at the corresponding frequency. As 4H-SiC is having lesser Rs value than diamond, it can deliver more power to the output RF circuit as compared to diamond-based IMPATT diode.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Midford, T.A., Bernick, R.L.: Millimeter wave CW IMPATT diodes and oscillators. IEEE Trans. Microw. Theory Tech. 27, 483–492 (1979). https://doi.org/10.1109/TMTT.1979.1129653
Roy, U.C., Gupta, A.K.: Measurement of electrical series resistance of W-band Si IMPATT diode. In: Proceedings of 2nd Asia Pacific Microwave Conference, Beijing, China (1988)
Miswa, T.: Multiple uniform layer approximation in analysis of negative resistance in p-n junction in breakdown. IEEE Trans. Electron Devices 14, 795 (1967). https://doi.org/10.1109/T-ED.1967.16113
Alderstein, M.G., Holway, L.F., Chu, S.L.G.: Measurement of series resistance in IMPATT diodes. IEEE Trans. Electron Devices 30, 179–182 (1983). https://doi.org/10.1109/T-ED.1983.21092
Mitra, M., Das, M., Kar, S., Roy, S.K.: A study of the electrical series resistance of silicon IMPATT diodes. IEEE Trans. Electron Devices 40, 1890–1893 (1993). https://doi.org/10.1109/16.277354
Ghivela, G.C., Sengupta, J., Mitra, M.: Ka band noise comparison for Si, Ge, GaAs, InP, WzGaN, 4H-SiC based IMPATT diode. Int. J. Electron. Lett. 7, 107–116 (2019). https://doi.org/10.1080/21681724.2018.1460869
Ghivela, G.C., Sengupta, J.: Prospects of impact avalanche transit time diode based on chemical vapor deposited diamond substrate. J. Electron. Mater. 48, 1044–1053 (2019). https://doi.org/10.1007/s11664-018-6821-5
Sengupta, J., Ghivela, G.C., Mitra, M.: Dynamic characterization and noise analysis of 4H-SiC IMPATT diode at Ka band. Int. J. Soft Comput. Eng. 4, 145–149 (2014)
Sengupta, J., Ghivela, G.C., Gajbhiye, A., Mitra, M.: Measurement of noise and efficiency of 4H-SiC IMPATT diode at Ka band. Int. J. Electron. Lett. 4, 134–140 (2016). https://doi.org/10.1080/21681724.2014.966774
Ghivela, G.C., Sengupta, J., Mitra, M.: Space charge effect of IMPATT diode using Si, Ge, GaAs, InP, WzGaN, 4H-SiC at Ka band. IETE J. Educ. 58, 61–66 (2017). https://doi.org/10.1080/09747338.2017.1378132
Sengupta, J., Ghivela, G.C., Gajbhiye, A., Jothe, B., Mitra, M.: Temperature dependence of 4H-SiC IMPATT diode at Ka band. Int. J. Electr. Electron. Comput. Syst. 19, 1–5 (2014)
Brooker, G.M.: Long-range imaging radar for autonomous navigation. Ph.D. dissertation, University of Sydney. Aerospace, Mechanical and Mechatronic Engineering, p. 231 (2006)
Trew, R.J., Yan, J.B., Mock, P.M.: The potential of diamond and SiC electronic devices for microwave and millimeter wave power applications. Proc. IEEE 79, 598–620 (1991). https://doi.org/10.1109/5.90128
Watanabe, T., Teraji, T., Ito, T., Kamakura, Y., Taniguchi, K.: Monte Carlo simulations of electron transport properties of diamond in high electric fields using full band structure. J. Appl. Phys. 95, 4866–4874 (2004). https://doi.org/10.1063/1.1682687
Pal, T.K.: Series resistance of silicon millimeter wave (Ka-Band) IMPATT diodes. Def. Sci. J. 59, 1–5 (2009)
Scharfetter, D.L., Gummel, H.K.: Large-signal analysis of a silicon read diode oscillator. IEEE Trans. Electron Devices 16, 64–77 (1969). https://doi.org/10.1109/T-ED.1969.16566
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2020 Springer Nature Singapore Pte Ltd.
About this paper
Cite this paper
Jothe, B., Ghivela, G.C., Sengupta, J. (2020). Parasitic Series Resistance for 4H-SiC and Diamond-Based IMPATT Diode at Ku Band. In: Dutta, D., Kar, H., Kumar, C., Bhadauria, V. (eds) Advances in VLSI, Communication, and Signal Processing. Lecture Notes in Electrical Engineering, vol 587. Springer, Singapore. https://doi.org/10.1007/978-981-32-9775-3_56
Download citation
DOI: https://doi.org/10.1007/978-981-32-9775-3_56
Published:
Publisher Name: Springer, Singapore
Print ISBN: 978-981-32-9774-6
Online ISBN: 978-981-32-9775-3
eBook Packages: EngineeringEngineering (R0)