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Thickness dependence of temperature coefficient of resistance and neel temperature in MnTe films

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Thin Film Laboratory, Department of Physics, University of the West Indies St. Augustine, Trinidad (W.I.)

    V. Thanigaimani & M. A. Angadi

Authors
  1. V. Thanigaimani
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  2. M. A. Angadi
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Thanigaimani, V., Angadi, M.A. Thickness dependence of temperature coefficient of resistance and neel temperature in MnTe films. J Mater Sci Lett 12, 1052–1056 (1993). https://doi.org/10.1007/BF00420217

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  • DOI: https://doi.org/10.1007/BF00420217

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