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Application of X-ray photoelectron spectroscopy to quantitative analysis without standards

Anwendung der Röntgenphotoelektronen-Spektroskopie für die quantitative Analyse ohne Standards

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Zusammenfassung

Das Problem wird diskutiert unter Berücksichtigung der mittleren freien Weglänge der emittierten Elektronen gemäß den Gleichungen von Lotz und Powell, sowie dem Photoionisationsquerschnitt berechnet nach Scofield. Experimentell wurde der relative Wert für die mittlere freie Weglänge gefunden. Die Schwierigkeiten bei der Herstellung von Standards werden an Hand verschiedener fester Lösungen und Oxide beschrieben.

Summary

The application of X-ray photoelectron spectroscopy to quantitative analysis without standards is discussed considering the mean free path of ejected electrons calculated by Lotz's equation or Powell's equation and the photoionization cross section calculated according to Scofield. The relative value of mean free path experimentally obtained and the difficulties of the preparation of standards are described with regard to various solid solution samples and oxide compounds.

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Authors and Affiliations

  1. The Research Institute for Iron, Steel and Other Metals, Tohoku University, Sendai, Japan

    Kichinosuke Hirokawa & Masaoki Oku

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  1. Kichinosuke Hirokawa
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  2. Masaoki Oku
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Hirokawa, K., Oku, M. Application of X-ray photoelectron spectroscopy to quantitative analysis without standards. Z. Anal. Chem. 285, 192–198 (1977). https://doi.org/10.1007/BF00453564

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  • DOI: https://doi.org/10.1007/BF00453564

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