Abstract
Ionic and electronic conductivity and compressive creep of hot-pressed polycrystalline acceptor-dominated Al2O3 were measured as a function of oxygen partial pressure and grain size varying from 3 to 200 μm. Hole conduction shows a slight preference for grainboundaries; ionic conduction is slightly hindered by grain boundaries, indicating that fast oxygen grain-boundary diffusion involving charged species does not occur. Conductivity and creep are accounted for on the basis of a model in which there is fast grain-boundary migration by a neutral oxygen species.
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Hou, L.D., Tiku, S.K., Wang, H.A. et al. Conductivity and creep in acceptor-dominated polycrystalline Al2O3 . J Mater Sci 14, 1877–1889 (1979). https://doi.org/10.1007/BF00551027
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DOI: https://doi.org/10.1007/BF00551027