Skip to main content
SpringerLink
Log in

The quantitative calculation of SiC polytypes from measurements of X-ray diffraction peak intensities

  • Papers
  • Published:
Journal of Materials Science Aims and scope Submit manuscript

    We’re sorry, something doesn't seem to be working properly.

    Please try refreshing the page. If that doesn't work, please contact support so we can address the problem.

Abstract

An experimental determination on powder mixtures of SiC-3C and 6H polytypes using an X-ray goniometer system showed the possibility of quantitative determination of polytype fraction directly from peak intensities. In combination with calculated X-ray intensities of 15R and 4H polytype, the method yields a simple equation system for the relative quantities of SiC polytypes 15R, 6H, 4H and 3C in polycrystalline samples and powder mixtures.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. J. Ruska, L. J. Gauckler and G. Petzow, Sci. Ceram. 9 (1977) 332.

    Google Scholar 

  2. N. W. Thibault, Amer. Mineral. 29 (1944) 249, 327.

    Google Scholar 

  3. P. T. B. Schaffer, Acta Cryst. B25 (1969) 477.

    Google Scholar 

  4. A. L. Hannam and P. T. B. Schaffer, J. Appl. Cryst. 2 (1969) 45.

    Google Scholar 

  5. S. F. Bartram, Report 75 CRD 022, General Electric Company, March (1975).

  6. R. Wyckoff, “Crystal Structures”, Vol. 1, 2nd Edn. (Interscience, New York, 1963) 113–20.

    Google Scholar 

  7. “International Tables for X-Ray Crystallography”, Vol. 3, edited by C. H. MacGillavry and G. D. Rieck (Kynoch Press, Birmingham, 1962) 202–3.

    Google Scholar 

Download references

Author information

Author notes

  1. J. Ruska

    Present address: Rosenthal AG, Selb, West Germany

  2. L. J. Gauckler

    Present address: Swiss Aluminium Ltd, CH-8212, Neuhausen, Switzerland

  3. J. Lorenz

    Present address: University of Michigan, 48109, Ann Arbor, Mich., USA

Authors and Affiliations

  1. Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaften, 7000, Stuttgart-80, West Germany

    J. Ruska, L. J. Gauckler, J. Lorenz & H. U. Rexer

Authors
  1. J. Ruska
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. L. J. Gauckler
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. J. Lorenz
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. H. U. Rexer
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Ruska, J., Gauckler, L.J., Lorenz, J. et al. The quantitative calculation of SiC polytypes from measurements of X-ray diffraction peak intensities. J Mater Sci 14, 2013–2017 (1979). https://doi.org/10.1007/BF00551044

Download citation

  • Received:

  • Accepted:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00551044

Keywords

Search

Navigation