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Self-diffusion in Mg2SiO4 (forsterite) at high temperature

Selbstdiffusion in Mg2SiO4 (Forsterit) bei hoher Temperatur: Modelluntersuchung für SIMS-Analysen an keramischen Oberflächen

A model case study for SIMS analyses on ceramic surfaces

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Summary

The use of neutral primary particles for secondary ion mass spectrometry (NPB-SIMS) makes it possible to analyse the isotope concentration profiles of all constituent elements in Mg2SiO4 simultaneously. The results indicate

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Authors and Affiliations

  1. Fachbereich Metallurgie und Werkstoffwissenschaften, Technische Universität Clausthal, D-3392, Clausthal-Zellerfeld, Federal Republic of Germany

    K. Andersson & G. Borchardt

  2. Ecole des Mines, Laboratoire de Physique du Solide, F-54042, Nancy Cédex, France

    S. Scherrer & S. Weber

Authors
  1. K. Andersson
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  2. G. Borchardt
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  3. S. Scherrer
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  4. S. Weber
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Andersson, K., Borchardt, G., Scherrer, S. et al. Self-diffusion in Mg2SiO4 (forsterite) at high temperature. Z. Anal. Chem. 333, 383–385 (1989). https://doi.org/10.1007/BF00572330

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  • DOI: https://doi.org/10.1007/BF00572330

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