Skip to main content
Log in

Resonant measurements of surface resistance of high-T c superconducting films: How good or bad are they?

  • Symposium Articles
  • Published:
Journal of Superconductivity Aims and scope Submit manuscript

Abstract

Errors in measurements of surface resistanceR s of HTS materials are due to discrepancy between a mathematical model describing physical phenomena and a real measurement environment, finite accuracy of measurements of theQ-factor, and finite accuracy of constants used for calculation ofR s . In this paper we analyze errors inR s due to uncertainties in theQ-factor, geometrical coefficients, loss tangent,R scu, and other factors when a cylindrical copper cavity with an HTS end plate, a stripline resonator, and sapphire rod resonators are used for HTS characterization.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. H. Pielet al., Physica C 153, 1604 (1988).

    Google Scholar 

  2. R. J. Delayen, K. C. Goretta, P. B. Poeppel, and K. W. Shepard,Appl. Phys. Lett. 52, 930 (1988).

    Google Scholar 

  3. C. Zahopulos, W. L. Kennedy, and S. Sridhar,Appl. Phys. Lett. 52, 2168 (1988); J. P. Cariniet al., Phys. Rev. B 37, 9726 (1988).

    Google Scholar 

  4. S. Sridhar and W. L. Kennedy,Rev. Sci. Instrum. 49, 531 (1988).

    Google Scholar 

  5. C. S. Nicholset al., Phys. Rev. B 38, 11970 (1988).

    Google Scholar 

  6. J. Fiedziuszko and P. D. Heidmann,IEEE MTT-S Digest, 555 (1989).

  7. J. S. Martenset al., IEEE Trans. Magn. MAG-25, 984 (1989).

    Google Scholar 

  8. A. Valenzuela and P. Russer,Appl Phys. Lett. 55, 1029 (1989).

    Google Scholar 

  9. J. H. Takemotoet al., IEEE Trans. MTT 37, 1650 (1989).

    Google Scholar 

  10. R. C. Taber,Rev. Sci. Instrum. 61, 2200 (1990).

    Google Scholar 

  11. J-C Mage and D. Dieumegard,AGARD Conf. 10-1 (1990).

  12. J. R. Delayen, C. L. Bohn, and C. T. Roche,Rev. Sci. Instrum. 61, 2207 (1990).

    Google Scholar 

  13. F. A. Mirandaet al., Physica C 168, 91 (1990).

    Google Scholar 

  14. K. M. Skrehot and Kai Chang,IEEE Trans. MTT 38, 34 (1990).

    Google Scholar 

  15. D. E. Oates, A. C. Anderson, and P. M. Mankiewich,J. Supercond. 3, 251 (1990).

    Google Scholar 

  16. Y. Kobayashi, T. Imai, and H. Kayano,IEEE MTT-S Digest, 281 (1990).

  17. W. Cooke,Solid Stare Commun. 73, 297 (1990).

    Google Scholar 

  18. J. S. Martenset al. Appl. Phys. Lett. 58, 2543 (1991).

    Google Scholar 

  19. O. L. Loppiset al. Solid State Commun. 78, 631 (1991).

    Google Scholar 

  20. M. Satoet al. IEICE Trans. E-74, 1980 (1991).

    Google Scholar 

  21. M. Choreyet al. IEEE Trans. MTT 39, 1480 (1991).

    Google Scholar 

  22. G. Kuhleman and J. H. Hinken,IEEE Trans. Instrum. Measur. 40, 539 (1991).

    Google Scholar 

  23. T. W. Button and N. McN. Alford,Appl. Phys. Lett. 60, 1378 (1992).

    Google Scholar 

  24. J. E. Ceremuga,Supercond. Sci. Technol. 5, 398 (1992).

    Google Scholar 

  25. N. Kleinet al., IEEE Trans. Appl. Supercond. 3, 1102 (1993).

    Google Scholar 

  26. C. Wilker, Z-Y Shen, N. Nguyen, and M. Brenner,IEEE Trans. Appl. Supercond. 3, 457 (1993).

    Google Scholar 

  27. K. Zhanget al., Appl. Phys. Lett. 62, 3019 (1993).

    Google Scholar 

  28. J. Krupkaet al., IEEE Trans. Appl. Supercond. 3, 3043 (1993).

    Google Scholar 

  29. R. Piintoet al., J. Appl. Phys. 73, 5105 (1993).

    Google Scholar 

  30. E. K. Moseret al., Phys. Rev. B 49, 4199 (1994).

    Google Scholar 

  31. C. J. Booth, Dong Ho Wu, and S. M. Anlage,Rev. Sci. Instrum. 65, 2082 (1994).

    Google Scholar 

  32. F. Davis (HP Santa Rosa Division), private communication.

  33. E. L. Ginzton,Microwave Measurements (McGraw Hill, New York, 1957).

    Google Scholar 

  34. D. Kajfez and P. Guillon,Dielectric Resonators (Vector Fields, 1990).

  35. D. Kaifez,Q-Factor (Vector Fields, 1994).

  36. Z. Ma,Ph.D Thesis, G.L. Report No. 5298, Stanford University (1995).

  37. A. N. Luiten, A. G. Mann, and D. G. Blair, submitted toIEEE Trans Instr. Meas. (1994).

  38. K. Geher,Tolerance and Sensitivity of Electronic Circuits (PWNT, 1978).

Download references

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

About this article

Cite this article

Ceremuga, J., Krupka, J. & Kościuk, T. Resonant measurements of surface resistance of high-T c superconducting films: How good or bad are they?. J Supercond 8, 681–689 (1995). https://doi.org/10.1007/BF00727491

Download citation

  • Received:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF00727491

Key words

Navigation