Abstract
High-T c thin films continue to be of interest for passive device applications at microwave frequencies, but nonlinear effects may limit the performance. To understand these effects we have measured the nonlinear surface impedanceZ s in a number of YBa2Cu3O7−x thin films as a function of frequency from 1 to 18 GHz, rf surface magnetic fieldH rf to 1500 Oe, and temperature from 4 K toT c . The results at lowH rf are shown to agree quantitatively with a modified coupled-grain model and at highH rf with hysteresis-loss calculations using the Bean critical-state model applied to a thin strip. The loss mechanisms are extrinsic properties resulting from defects in the films. We also report preliminary measurements of the nonlinear impedance of Josephson junctions, and the results are related to the models of nonlinearZ S . The implications of nonlinearZ S for devices are discussed using the example of a five-pole bandpass filter.
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The authors thank Dr. Alfredo Anderson of Lincoln Laboratory for many YBCO films and technical discussions concerning film properties. We thank Dr. J. Halbritter for numerous discussions and ideas. We thank also Prof. S. Sridhar, B. Willemsen, N. Belk, and Dr. J. Herd for technical discussions. We are deeply indebted to R. P. Konieczka and D. J. Baker for resonator assembly and technical support. Drs. R. W. Ralston, T. C. L. G. Sollner, and P. Carr are thanked for technical guidance and support.
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Oates, D.E., Nguyen, P.P., Dresselhaus, G. et al. Nonlinear surface impedance of YBCO thin films: Measurements, modeling, and effects in devices. J Supercond 8, 725–733 (1995). https://doi.org/10.1007/BF00727495
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DOI: https://doi.org/10.1007/BF00727495