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Characterization of the surface morphology of diblock copolymers via low-voltage, high-resolution scanning electron microscopy and atomic force microscopy

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Department of Materials Science and Engineering, Massachusetts Institute of Technology, 02139, Cambridge, MA, USA

    D. W. Schwark, D. L. Vezie, J. R. Reffner & E. L. Thomas

  2. Chemistry Division, Oak Ridge National Laboratory, 37831-6197, Oak Ridge, TN, USA

    B. K. Annis

Authors
  1. D. W. Schwark
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  2. D. L. Vezie
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  3. J. R. Reffner
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  4. E. L. Thomas
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  5. B. K. Annis
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Schwark, D.W., Vezie, D.L., Reffner, J.R. et al. Characterization of the surface morphology of diblock copolymers via low-voltage, high-resolution scanning electron microscopy and atomic force microscopy. J Mater Sci Lett 11, 352–355 (1992). https://doi.org/10.1007/BF00729180

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  • DOI: https://doi.org/10.1007/BF00729180

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