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Surface characterization of CdS0.62Se0.38 by X-ray photoelectron spectroscopy

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Department of Chemistry, Indian Institute of Technology, 600 036, Madras, India

    I. B. Rufus, V. Ramakrishnan, B. Viswanathan & J. C. Kuriacose

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  1. I. B. Rufus
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  2. V. Ramakrishnan
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  3. B. Viswanathan
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  4. J. C. Kuriacose
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Rufus, I.B., Ramakrishnan, V., Viswanathan, B. et al. Surface characterization of CdS0.62Se0.38 by X-ray photoelectron spectroscopy. J Mater Sci Lett 11, 252–254 (1992). https://doi.org/10.1007/BF00729403

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  • DOI: https://doi.org/10.1007/BF00729403

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