Abstract
Grain boundary morphology and structure has been examined by means of transmission electron microscope lattice imaging, and a plausible correlation is advanced between the grain boundary structure and its transgranular ionic resistivity and capacitance. The geometrical aspects and resistance of the grain boundaries depend on whether or not dislocations with ab=1 spinel block can accommodate the misorientation. Such dislocations are shown to exist in a wide range of grain boundaries. The wide spread in grain boundary structure and the complexity of the microstructure, making parallel current path considerations necessary, can account qualitatively for the deviation from the ideal Maxwell dispersive behaviour. However, a physically relevant interpretation of equivalent circuit parameters determined from dispersive type measurements seems not justified. Several model circuits are used to illustrate the interpretational difficulties. The structure and effects of intergranular phases also have been studied and are discussed.
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De Jonghe, L.C. Grain boundaries and ionic conduction in sodium beta alumina. J Mater Sci 14, 33–48 (1979). https://doi.org/10.1007/BF01028326
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DOI: https://doi.org/10.1007/BF01028326