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Atomic force microscopy on polymers and polymer related compounds

1. Cold-extruded polyethylene

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Abstract

Results of Atomic Force Microscopy (AFM) studies on cold-extruded polyethylene (PE) are presented. AFM images from the range 700×700 nm down to the atomic scale were obtained on a flat surface, which was prepared by cutting a rod-like sample along the extrusion direction. Large scale AFM micrographs of PE reveal the fibrillar morphology of the uniaxially oriented material. Microfibrils with diameters in the range 20–90 nm are aligned parallel to the extrusion direction. In the smaller scale images the oriented patterns were assigned to the individual polymer chains. The surface texture pattern shows chain overlapping as a result of the extrusion process. Parts of extended chains were also found. AFM responses of individual methylene groups have been resolved.

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Magonov, S.N., Qvarnström, K., Elings, V. et al. Atomic force microscopy on polymers and polymer related compounds. Polymer Bulletin 25, 689–694 (1991). https://doi.org/10.1007/BF01032666

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