Abstract
X-ray absorption near-edge structure (XANES) and extended X-ray absorption fine structure (EXAFS) have been used to study the charge states and atomic environments of Ti+ ions implanted into a single crystal sapphire substrate. Fluorescence techniques have been shown capable of detecting signals from the implanted ions even though the implant density in the ∼100μm thick specimen used is ∼ 0.02 at% (the implant profile all being within 0.2μm of the surface). By comparison with TiO2, Ti2O3 and TiO standards, XANES data suggest that the implant species environment is disordered. Further, EXAFS Fourier transforms show that the first shell radius of the implant species is between that of the TiO and Ti2O3 standards. Again, this indicates considerable structural disorder. After annealing the implanted specimen in air at 1150° C for 2 h, a shift towards the shell radius of the TiO2 structure is observed together with a similar change in the XANES appearances. Our conclusion is that the initial titanium ion implant into sapphire exists in both the Ti2+ and Ti3+ charge states and is located in a range of sites in the radiation-damaged material. Annealing produces a shift in charge state towards Ti4+. Implications for the solid solution hardening effect of the implant in sapphire are discussed.
Similar content being viewed by others
References
G. Dearnaley,Thin Solid Films 107 (1983) 315.
P. J. Burnett andT. F. Page,J. Mater. Sci. 19 (1984) 3524.
Idem, in “ Plastic Deformation of Ceramic Materials, II”, edited by R. E. Tressler and R. C. Bradt (Plenum Press, New York, 1984) pp. 669–80.
C. J. McHargue andC. S. Yust,J. Amer. Ceram. Soc. 67 (1984) 117.
P. J. Burnett andT. F. Page,J. Mater. Sci. 19 (1984) 845.
T. E. Mitchell andA. H. Heuer,Mater. Sci. Eng. 28 (1977) 81.
J. B. Pendry,Comm. Solid State Phys. X (1983) 219.
P. A. Lee andJ. B. Pendry,Phys. Rev. B11 (1975) 2795.
A. J. Bourdillon, R. F. Pettifer andE. A. Marseglia,J. Phys. C 12 (1979) 3889–3897.
E. W. White andH. A. Mckinstry, in “Advances in X-ray Analysis”, edited by J. B. Newkirk and G. R. Mallett (Plenum Press, New York, 1966) p. 376.
B. K. Teo andP. A. Lee,J. Amer. Chem. Soc. 101 (1979) 2815.
A. J. Bourdillon andG. P. Tebby,J. Microsc. (1985).
G. P. Tebby, A. J. Bourdillon, R. T. Philips andE. A. Marseglia, in “EXAFS and Near Edge Structure III” edited by K. O. Hodgson, B. Hedman and J. G. Penner-Hahn, Springer Proc. Phys. Vol. 2 (Springer-Verlag, Berlin, 1984) pp. 86–8.
P. H. Citrin, P. Eisenberger andB. M. Kincaid,Phys. Rev. Lett. 36 (1976) 1346.
R. W. G. Wyckoff, “Crystal Structures”, 2nd Ed. (Wiley, New York, 1964).
A. Perez, M. Treilleux, P. Thevenard, G. Abouchacra, G. Marest, L. Fritsch andJ. Serughetti,Proc. Mater. Res. Soc. 7 (1982) 159.
P. J. Burnett, PhD thesis, University of Cambridge (1984).
G. C. Farlow, C. W. White, C. J. Mchargue andB. R. Appleton,Proc. Mat. Res. Soc. 27 (1984) 395.
B. J. Pletka, T. E. Mitchell andA. H. Heuer, in “Deformation of Ceramic Materials”, edited R. C. Bradt and R. E. Tressler (Plenum Press, New York, 1975) pp. 181–94.
C. E. Wicks andF. E. Block, in “US Bureau of Mines Bulletin 605” (US Government Printing Office Washington, 1963) p. 120.
E. M. Levin andH. E. Mcmurdie, in “Phase Diagrams for Ceramists, 1975 Supplement” (The American Ceramic Society, Columbus, Ohio, 1975) p. 135.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Bourdillon, A.J., Bull, S.J., Burnett, P.J. et al. The charge state of titanium ions implanted into sapphire: An EXAFS investigation. J Mater Sci 21, 1547–1552 (1986). https://doi.org/10.1007/BF01114707
Received:
Revised:
Issue Date:
DOI: https://doi.org/10.1007/BF01114707