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Determination of slope and strain contours by double-exposure shearing interferometry

Paper presents a method that also uses interference phenomena in coherent light, but gives directly patterns of spatial derivatives of displacements

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Abstract

An interferometric technique is used to determine directly patterns of derivatives of displacements. In the case of plate models, the fringes are loci of equal slope; for specimens provided with surface gratings, one forms patterns of partial derivatives of in-plane displacements. A theory for the interpretation of the interference fringes in terms of displacements is outlined; some experimental applications illustrate the paper.

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Abbreviations

A * :

complex conjugate ofA

D :

stiffness of plate

E :

Young's modulus

f :

focal distance

h :

thickness of plate

I, (x, y) :

intensity distribution

I :

moment of inertia

i :

imaginary unit

M, M x, My :

bending moments

M xy :

twisting moment

p :

distance

P :

magnitude of point load

ΔS :

optical path-length difference

t(x, y) :

amplitude distribution

U(x, y) :

field distribution

v :

contraction coefficient (Poisson's ratio)

w :

deflection

x, y, z :

Cartesian coordinates

σ, σ1, σ2 :

magnitude of shift

ε:

strain

ψ:

slope

μm :

micrometer

τ:

shear strain

\(\mathop \Delta \limits_{}^2 Q\) :

increase ofQ between state 1 and 2

\(< \mathop F\limits_{}^1 > \) :

approximate value ofF

References

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Boone, P.M. Determination of slope and strain contours by double-exposure shearing interferometry. Experimental Mechanics 15, 295–302 (1975). https://doi.org/10.1007/BF02318660

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  • DOI: https://doi.org/10.1007/BF02318660

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