Abstract
In automated photoelasticity, there are some advantages in using white light; however, the theory underlying many such systems, namely phase stepping, is based on monochromatic light. The effect of using white light has been investigated both by experiment and by a simulation of a polariscope. The simulation has been validated and used to explore the use of bandwidth filters to control the errors caused by using white light. These errors were found to be dependent on the form of the spectrum of the light and to be large for high fringe orders.
Similar content being viewed by others
Abbreviations
- α:
-
relative phase retardation
- C m ,C λ :
-
stress-optic coefficient at matching wavelength, and other wavelengths
- ε:
-
quarter-wave plate error
- f :
-
fringe constant (Nm−1/fringe)
- F(λ):
-
response curve of monochromatic CCD camera
- I 0 :
-
light intensity when all the fast axes of the polariscope are parallel to each other
- I 1,...,I 6 :
-
light intensity for phase steps 1 to 6
- I i :
-
light intensity in ideal conditions
- I m :
-
stray light intensity
- (I)λ, (I)w :
-
light intensity: nonmatching monochromatic light source, white light source
- λ, λ m :
-
wavelength (nm), matching wave-length for the quarter-wave plates (nm)
- N, N m :
-
fringe order at matching wavelength
- θ:
-
isoclinic angle
- ρ1,ρ2,ρ3 :
-
angles between the fast axes of the first quarter-wave plate, second quarter-wave plate and analyzer to the fast axis of the polarizer
- S λ :
-
combined response of light source and monochromatic camera
- σ1,σ2 :
-
principal stresses
- t :
-
thickness of the specimen
- T(λ):
-
products of transmission ratio of every element in the polariscope
- ξ1,ξ2 :
-
retardation caused by first and second quarter-wave plate, respectively
References
Patterson, E.A., “Automated Photoelastic Analysis,”Strain,24,15–20 (1988).
Sapaly, J., “Contribution a l'etude de la photoextensometric statique et dynamique,” Th. Sc. Phys., Series A3761, 4612 (1961).
Allison, I.M. and Nurse, P., “Automatic Acquisition of Photoelastic Data,” Proc. JBCSA Conf. Recording and Interpretation of Engineering Measurements, Inst. Mar. Engrs., London, 203–207 (1972).
Robert, A.J., “New Methods in Photoelasticity,” EXPERIMENTAL MECHANICS,7,224–232 (1967).
Muller, R.K. andSaackel, L.R., “Complete Automatic Analysis of Photoelastic Fringes,” EXPERIMENTAL MECHANICS,19,245–252 (1979).
Seguchi, Y., Tanita, Y., andWatanbe, M., “Computer Aided Fringe Pattern Analysis—A Case of Photoelastic Fringe,” EXPERIMENTAL MECHANICS,19,362–370 (1979).
Umezaki, E., Tamaki, T., andTakahashi, S., “Automatic Stress Analysis from Photoelastic Fringes Due to Image Processing Using a Personal Computer,”Proc. Soc. Photo.,504,127–134 (1984).
Voloshin, A.S. andBurger, C.P., “Half-fringe Photoelasticity—A New Approach to Whole Field Stress Analysis,” EXPERIMENTAL MECHANICS,23,304–314 (1983).
Redner, A.S., “Photoelastic Measurements by Means of Computer Assisted Spectral Contents Analysis,” Proc. 5th Int. Conf. Experimental Mechanics, Montreal, 421–427 (1984).
Sanford, R.J. and Iyengar, V., “The Measurement of the Complete Photoelastic Fringe Order Using a Spectral Scanner,” Proc. Spring Conf. Experimental Mechanics, 160–168 (1985).
Kihara, T., “Automatic Whole-field Measurement of Photoelasticity Using Linear Polarized Incident Light,”Proc. 9th Int. Conf. Experimental Mechanics, Copenhagen, Vol. 2, 821–827 (1990).
Patterson, E.A. andWang, Z.F., “Towards Full-field Automated Photoelastic Analysis of Complex Components,”Strain,27,49–56 (1991).
Sarma, A.V.S.S.R., Pillai, S.A., Subramanian, G., andVaradan, T.K., “Computerised Image Processing for Whole-field Determination of Isoclinics and Isochromatics,” EXPERIMENTAL MECHANICS,31,24–29 (1993).
Otani, Y., Shimada, T., Yoshizawa, T., andUmeda, N., “Two-dimensional Birefringence Measurement Using the Phase Shifting Technique,”Opt. Eng.,33,1604–1609 (1994).
Morimoto, Y., Morimoto, Y., Jr., and Hayashi, T., “Separation of Isochromatics and Isoclinics Using Fourier Transforms and its Accuracy,” Proc. SEM Spring Conf. Experimental Mechanics, 1149–1158 (1993).
Quan, C., Bryston-Cross, P.J., andJudge, T.R., “Photoelasticity Stress Analysis Using Carrier Fringe and FFT Techniques,”Opt. Lasers Eng.,18,79–108 (1993).
Patterson, E.A., Ji, W., andWang, Z.F., “On Image Analysis for Birefringence Measurements in Photoelasticity,”Opt. Lasers Eng.,28,17–37 (1997).
Patterson, E.A. and Wang, Z.F., “Simultaneous Observation of Phase-stepped Photoelastic Images,” J. Strain Anal.
Patterson, E.A. and Wang, Z.F., “Phase-stepping in Photoelasticity Using White Light,” Proc. SEM Spring Conf., Bellevue, WA, 366 (1997).
Haake, S.J. andPatterson, E.A., “The Dispersion of Birefringence in Photoelastic Materials,”Strain,29,3–7 (1993).
Kenny, B., “The Casting of a Low Exotherm Resin,”J. Sci. Instruments,42,719–720 (1965).
Wang, Z.F. andPatterson, E.A., “Use of Phase-stepping with Demodulation and Fuzzy Sets for Birefringence Measurement,”Opt. Lasers Eng.,22,91–104 (1995).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Ji, W., Patterson, E.A. Simulation of errors in automated photoelasticity. Experimental Mechanics 38, 132–139 (1998). https://doi.org/10.1007/BF02321656
Received:
Revised:
Issue Date:
DOI: https://doi.org/10.1007/BF02321656