Abstract
A new method of photoelastic measurement has been developed. The light emerging from a polariscope is spectrally separated and projected on a photodiode array. It is shown that the relative retardation can be retrieved from light intensity measured at several wavelengths. Key parameters affecting the precision of this approach are discussed and evaluated.
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References
Young, W.C., “An Automated Process for Three-dimensional Photoelastic Analysis,”Experimental Mechanics,9 (6),275–280 (1967).
Redner, A.S., “New Automatic Polariscope System,”Experimental Mechanics,14 (12),486–491 (1974).
Pant, B., “A Method for Determining Integral Fringe Orders in Photoelastic Analysis,”Experimental Mechanics,3 (7),173–174 (1963).
Srinath, L.S. andSarma, A.V.S.S.S.R., “Determination of Integral Fringe Order in Photoelasticity,”Experimental Mechanics,13 (3),138–141 (1973).
Pindera, J.T. andCloud, G., “On Disperison of Birefringence of Photoelastic Materials,”Experimental Mechanics,6 (9),470–480 (1966).
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Redner, A.S. Photoelastic measurements by means of computer-assisted spectral-contents analysis. Experimental Mechanics 25, 148–153 (1985). https://doi.org/10.1007/BF02328805
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DOI: https://doi.org/10.1007/BF02328805