Abstract
The Al-Fe-Si intermetallics present in a commercial cast 6201 electrical conductor alloy have been studied using high resolution electron microscopy. The β-Al5FeSi phase is highly faceted and contains multiple (001) growth twins parallel to the growth direction. The α-Al8Fe2Si phase which forms in a Chinese script morphology has a nonfaceted interface with the aluminum matrix and exhibits no growth twinning. Formation of the β phase is believed to occurvia a peritectic decomposition of α-Al8Fe2Si at 612 °C. Observations made by transmission electron microscopy (TEM) support this hypothesis. When 30 ppm strontium is added to this alloy, the α phase is stabilized and very little β-Al5FeSi appears in the microstructure. A silicon-rich layer is found around the α-phase particles. It is proposed that strontium adsorbs to the α-phase interface, and in so doing, the diffusion of silicon into the α phase, necessary for its transformation to β, is prevented.
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Mulazimoglu, M.H., Zaluska, A., Gruzleski, J.E. et al. Electron microscope study of Al-Fe-Si intermetallics in 6201 aluminum alloy. Metall Mater Trans A 27, 929–936 (1996). https://doi.org/10.1007/BF02649760
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DOI: https://doi.org/10.1007/BF02649760