Abstract
In this paper, we analyze and discuss the roles of nine different scattering mechanisms—ionized impurity, polar and nonpolar optical, acoustic, dislocation, strain field, alloy disorder, neutral impurity, and piezoelectric—in limiting the hole mobilities in p-type Hg1−xCdxTe crystals. The analysis is based on obtaining a good fit between theory and experiment for the light and heavy hole drift mobilities by optimizing certain unknown (or at the most vaguely known) material parameters such as the heavy hole mobility effective mass, degree of compensation, and the dislocation and strain field scattering strengths. For theoretical calculations, we have adopted the relaxation time approach, keeping in view its inadequacy for the polar scattering. The energy dispersive hole relaxation times have been drawn from the published literature that take into account the p-symmetry of valence band wave functions. The temperature dependencies of multiple charge states of impurities and of Debye screening length have been taken into account through a numerical calculation for the Fermi energy. Mobility data for the present analysis have been selected from the HgCdTe literature to represent a wide range of material characteristics (x=0.2–0.4, p=3×1015–1×1017 cm−3 at 77K, μpeak≅200-1000cm2V−1s−1). While analyzing the light hole mobility, the acoustic deformation and neutral impurity potentials were also treated as adjustable. We conclude that
-
• the heavy hole mobility is largely governed by the ionized impurity scattering, unless the strain field or dislocation scattering below 50K, or the polar scattering above 200K, become dominant;
-
• the light hole mobility is mainly governed by the acoustic phonon scattering, except at temperatures below 30K where the neutral impurity, strain field and dislocation scattering also become significant;
-
• the intervalence scattering transitions make negligible impact on the heavy hole mobility, but virtually limit the light hole mobility;
-
• the alloy disorder scattering does not dominate in any temperature region, although it exercises some influence at intermediate temperatures;
-
• the heavy hole mobility effective mass ratio mhh/mo∼-0.28–0.33 for crystals with x<0.4; and
-
• the light hole band deformation potential constant is ∼12 eV.
Similar content being viewed by others
References
C.T. Elliott and I.L. Spain,Solid State Commun. 8, 2063 (1970).
C.T. Elliott,J. Phys. D4, 697 (1971).
W. Scott and R.J. Hager,J. Appl. Phys. 42, 803 (1971).
R.A. Reynolds, M.J. Brau, H. Kraus and R.T. Bate,Physics of Semimetals and Narrowgap Semiconductors, ed. D.L. Carter and R.T., Bate, (Oxford, England: Pergamon, 1971), p. 511.
C.T. Elliott, I. Melangailis, T.C. Harman and A.G. Foyt,J. Phys. Chem. Solids 33, 1527 (1972).
V.V. Ptashinskii and P.S. Kireev,Sov. Phys. Semicond. 6, 1398 (1973).
W. Scott, E.L. Stelzer and R.J. Hager,J. Appl. Phys. 47, 1408 (1976).
L.A. Bovina, Yu.N. Savchenko and V.L. Stafeev,Sov. Phys. Semicond. 9, 1362 (1976).
V.P. Ponomarenko, L.A. Bovina, V.I. Stafeev and V.P. Meshcheryakova,Sov. Phys. Semicond. 13, 260 (1979).
Yu.G. Arapov, B.B. Ponikarov, I.M. Tsidil'skovskii and I.M. Nesmelova,Sov. Phys. Semicond. 13, 409 (1979).
Yu.G. Arapov, B.B. Ponikarov, I.M. Tsidil'skovskii and N.G. Shelushinina,Sov. Phys. Semicond. 13, 1126 (1979).
A.I. Elizarov, V.I. Ivanov-Omskii and K.R. Kurbanov,Sov. Tech. Phys. Lett. 7, 466 (1981).
J. Calas and J. Allegre,Phys. Status Solidi B1112, 179 (1982).
O. Caporaletti and W.F.H. Micklethwaite,Phys. Lett. 89A, 151 (1982).
A.I. Elizarov, L.P. Zverev, V.V. Kruzhaev, G.M. Min'kov and O.E. Rut,Sov. Phys. Semicond. 17, 284 (1983).
A.I. Elizarov, V.I. Ivanov-Omskii, A.A. Korniyash and V.A. Petryakov,Sov. Phys. Semicond. 18, 125 (1984).
J.B. Mullin and A. Royle,J. Phys. D17, L69 (1984).
L.F. Lou and W.H. Frye,J. Appl. Phys. 56, 2253 (1984).
T.T.S. Wong, as referred to in Ref. 18.
M.C. Chen and J.A. Dodge,Solid State Commun. 59, 449 (1986).
M.J. Hyliands, J. Thompson, M.J. Bevan, K.T. Woodhouse and V. Vincent,J. Vac. Sci. Technol. A4, 2217 (1986).
A.I. Elizarov, V.V. Kruzhaev, G.M. Min'kov, M.S. Nikitin and O.E. Rut,Sov. Phys. Semicond. 21, 292 (1987).
D. Eger, A. Zemel, D. Mordowicz and A. Sher,Appl. Phys. Lett. 46, 989 (1985).
A. Zemel, A. Sher and D. Eger,J. Appl. Phys. 62, 1861 (1987).
V.I. Ivanov-Omskii, N.N. Berchenko and A.I. Elizarov,Phys. Status Solidi. A103, 11 (1987).
M.C. Chen,J. Appl. Phys. 65, 1571 (1989).
P. Höschl, P. Moravec, J. Franc, R. Grill and E. Belas,J. Appl. Phys. 70, 313 (1991).
L. Banyai and A. Aldea,Phys. Rev. 143, 652 (1966).
V.V. Voronkov, E.V. Solov'eva, M.I. Iglitsyn and M.N. Pivovarov,Sov. Phys. Semicond. 2, 1499 (1969).
M.C. Gold and D.A. Nelson,J. Vac. Sci. Technol. A4, 2040 (1986).
J.R. Meyer, F.J. Bartoli and C.A. Hoffman,J. Vac. Sci. Technol. A5, 3035 (1987).
D.D. Edwall, E.R. Gertner and W.E. TennantJ. Electron. Mater. 14, 245 (1985).
M.A. Berding, S. Krishnamurthy, A. Sher and A.-B. Chen,J. Vac. Sci. Technol. A5, 3014 (1987).
I. Makowski and M. Glicksman,J. Phys. Chem. Solids 34, 487 (1973).
S. Krishnamurthy, A. Sher and A.-B. Chen,Appl. Phys. Lett. 47, 160 (1985).
J.D. Wiley,Semiconductors and Semimetals, Vol. 10, ed. R.K. Willardson and A.C. Beer, (New York: Academic, 1975), Ch.2.
H. Brooks,Advan. Electron. Electron Phys. 7, 85 (1955).
E.O. Kane,J. Phys. Chem. Solids 1, 82 (1957).
M. Costato and L. Reggiani,Phys. Stat. Solidi B58, 471 (1973).
M. Costato and L. Reggiani,Phys. Stat., Solidi B58, 47 (1973).
T. Brudevoll, T.A. Fjeldly, J. Baek and M.S. Shur,J. Appl. Phys. 67, 7373 (1990).
F.J. Blatt,Physics of Electronic Conduction in Solids, (New York: McGraw-Hill, 1968), p. 121.
K. Seeger,Semiconductor Physics (New York: Springer-Verlag, 1987), p. 202.
H.F. Schaake, J.H. Tregilgas, A.J. Lewis and R.M. Everett,J. Vac. Sci. Technol. A1, 1625 (1983).
P. Yamamoto, Y. Miyamoto and K. Tanikawa,J. Cryst. Growth 72, 270 (1985).
F. Buch and C.N. Ahlquist,J. Appl. Phys. 45, 1756 (1974).
D.J. Williams and A.W. Vere,J. Vac. Sci. Technol. A4, 2184 (1986).
S. Cole,Properties of Mercury Cadmium Telluride, EMIS Datareviews Ser. No. 3, ed. J. Brice and P. Capper, (London and New York: INSPEC, IEE, 1987), p. 93.
W. Schröter,Defects and Radiation Effects in Semiconductors, Inst. Phys. Conf. Ser. No. 46, ed. J.H. Albany (Bristol and London, England: Institute of Physics, 1979), p. 114.
H. Kressel,Semiconductors and Semimetals Vol. 16, ed. R.K. Willardson and A.C. Beer, (New York: Academic, 1981), Ch.1.
W. Shockley,Phys. Rev. 91, 228 (1953).
G.L. Pearson, W.T. Read and F.J. Morin,Phys. Rev. 93, 93 (1954).
A.G. Tweet,Phys. Rev. 99, 1245 (1955).
W. Schröter,Phys. Stat. Solidi 21, 211 (1967).
W. Schröter and R. Labusch,Phys. Stat. Solidi 36, 539 (1969).
W.T. Read,Philos. Mag. 45, 775 (1954).
W.T. Read,Philos. Mag. 45, 1119 (1954)
W.T. Read,Philos. Mag. 46, 111 (1955).
R.M. Broudy and J.M. McClure,J. Appl. Phys. 31 1511 (1960).
H.C. Gatos and M.C. Lavine,J. Electrochem. Soc. 107, 427 (1960).
H.C. Gatos, H.C. Finn and M.C. Lavine,J. Appl. Phys. 32, 1174 (1961).
M.C. Lavine, H.C. Gatos and M.C. Finn,J. Electrochem. Soc. 108, 974 (1961).
R.K. Mueller and R.L. Jacobson,J. Appl. Phys. 33, 2341 (1962).
A.L. Esquivel, S. Sen and W.N. Lin,J. Appl. Phys. 47, 2588 (1976).
D.B. Holt,J. Appl. Phys. 31, 2231 (1960).
V.L. Bonch-Bruevich and V.B. Glasko,Sov. Phys.: Solid State 3, 26 (1961).
B. Pödör,Physica Stat. Solidi 16, K167 (1966).
P.A. Fedders,J. Appl. Phys. 54, 1804 (1983).
C. Erginsoy,Phys. Rev. 79, 1013 (1950).
A.I. Ansel'm,Sov. Phys.: JETP 24, 85 (1953).
N. Sclar,Phys. Rev. 104, 1559 (1956).
N. Sclar,Phys. Rev. 104, 1548 (1956), Eq. (36).
T.C. McGill and R. Baron,Phys. Rev. B11, 5208 (1975).
J.S. Blakemore,Phys. Rev. 22, 743 (1980).
J. Kossut,Phys. Stat. Solidi B86, 593 (1978).
E. Conwell and V.F. Weisskopf,Phys. Rev. 77, 388 (1950).
K. Seeger,Semiconductor Physics (New York: Springer-Verlag, 1987), p. 170.
P. Höschl, P. Moravec, V. Prosser, V. Szöcs and R. Grill,Phys. Stat. Solidi B145, 637 (1988).
R.S. Kim and S. Narita,Phys. Stat. Solidi B73, 741 (1976).
Y. Guldner, C. Rigaux, A. Mycielski and Y. CounderPhys. Stat. Solidi B82, 149 (1977).
Y. Guldner, C. Rigaux, A. Mycielski and Y. Counder,Phys. Stat. Solidi B81, 615 (1977).
B. Jensen and A. Torabi,J. Appl. Phys. 54, 5945 (1983). Eq. (13) of this reference, mhh/mo=0.35x+0.3(1−x), is based on the Eg (x,T) and ni relations given in Ref. 81.
J. Calas, J. Allegre and C. Fau,Phys. Stat. Solidi B107, 275 (1981).
T.C. Harman, W.H. Kleiner, A.J. Strauss, G.B. Wright, J.G. Mavroides, J.M. Honig and D.H., Dickey,Solid State Commun. 2, 305 (1964).
S.H. Groves, R.N. Brown and C.R. Pidgeon,Phys. Rev. 161, 779 (1967).
S.H. Groves, T.C. Harman and C.R. Pidgeon,Solid State Commun. 9, 451 (1971).
W.H. Weiler,Semiconductors and Semimetals, Vol. 16, ed. R.K. Willardson and A.G. Beer (New York: Academic, 1981), p. 119.
R.R. Galazka and T. Zakrzewski,Phys. Stat. Solidi 23, K39 (1967).
J.D. Wiley and R.N. Dexter,Phys. Rev. 181, 1181 (1969).
E. Finkman,J. Appl. Phys. 54, 1883 (1983).
D.L. Rode,Phys. Rev. B2, 4036 (1970).
D. Chattopadhyay and B.R. Nag,J. Appl. Phys. 45, 1463 (1974).
B. Pödör,Phys. Stat. Solidi B134, K145 (1986).
J.A. Mroczkowski and D.A. Nelson,J. Appl. Phys. 54, 2041 (1983).
G.L. Hansen and J.L. Schmit,J. Appl. Phys. 54, 1639 (1983). After the present analysis was completed, one of the authors has obtained a more accurate and general expression for ni (R.D.S. Yadava,Solid State Commun. 92, 357 [1994]).
B.R. Nag,Electron Transport in Compound Semiconductors (Berlin, Germany: Springer-Verlag, 1980), p. 104.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Yadava, R.D.S., Gupta, A.K. & Warrier, A.V.R. Hole scattering mechanisms in Hg1−xCdxTe. J. Electron. Mater. 23, 1359–1378 (1994). https://doi.org/10.1007/BF02649902
Received:
Issue Date:
DOI: https://doi.org/10.1007/BF02649902