Abstract
Irregularities at the interface in Cu x S/CdS thin films can be controlled by annealing CdS film prior to chemiplating. The interlayer formed on CdS films annealed at 200°C is comparatively smooth. In CdS films annealed at higher temperatures, the interlayer is rather thick and the CdS intrusions into this layer are thin. An ellipsometric technique is used for this study and the effective medium theory which is utilized to interpret the results is based on the difference in reaction rate in the grains as well as grain boundaries during chemiplating.
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References
Aspenes D E, Kelso S M, Logam R A and Bhat R 1986J. Appl. Phys. 60 754
Azzam R M A and Bashara N M 1977aEllipsometry and polarized light (Amsterdam: North Holland) Chpt. 4; 1977b, p. 255; 1977c, p. 359; 1977d, p. 266
Barnett A M, Bragagnole J A, Hall R B, Phillips J E and Meakin J D 1978Proc. 13th Photovoltaic Specialists Conf. (Washington DC: IEEE) p. 419
Bryant F J, Hariri A K and Scott C G 1983J. Phys. D16 2341
Chopra K L and Das S R 1983aThin film solar cells (New York: Plenum Press) p. 315; 1983b, p. 304
Cumberbatch T J, Barden P E and Durrant J 1988Thin Solid Films 167 169
Eser E and Hall R B 1981Thin Solid Films 86 31
Garnett R 1904Philos. Trans. R. Soc. London 203 385
Hall R D and Meakin J D 1979Thin Solid Films 63 203
Hall R B, Birkmire R W, Phillips J E and Meakin J D 1981Appl. Phys. Lett. 38 925
Iborra E, Santamaria J, Marlil I, Gonzalez-Diza G and Sanchaz-Quesda F 1988Solar Energy Mater. 17 279
Igalson M, Blankrewiex K and Trykozko 1988Phys. Status Solidi A108 K169
Logothetidis S 1989J. Appl. Phys. 65 2416
Nolly J, Abdulla K K and Vijayakumar K P 1987Phys. Status Solidi A101 K35
Noriah K H and Edington J W 1981Thin Solid Films 75 53
Partin L D 1988J. Appl. Phys. 63 1762
Petrovskii G T, Pshenitsyn V I, Antonov V A, Vasileva L K, Velitskaya E L and Yagovkin S V 1986Sov. Phys. Dokl (USA) 31 714
Rastogi A L and Salkalachen S 1982Thin Solid Films 97 191
Santamaria J, Iborra E, Gonzalez-Diaz G and Sanchez-Quesada F 1988Semicond. Sci. Technol. 3 781
Vedam K, MeMarr P J and Narayanan J 1985Appl. Phys. Lett. 47 339
Vedam K, Kum S Y and D’Aries L 1987Opt. Lett. 12 456
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Vijayakumar, K.P. Variations of interlayer structure in Cu x S/CdS bilayer thin film with annealing of CdS: an ellipsometric study. Bull. Mater. Sci. 14, 57–63 (1991). https://doi.org/10.1007/BF02745089
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DOI: https://doi.org/10.1007/BF02745089