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Bias- and efficiency-robustness of general M-estimators for regression with random carriers

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Smoothing Techniques for Curve Estimation

Part of the book series: Lecture Notes in Mathematics ((LNM,volume 757))

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Author information

Authors and Affiliations

  1. Eidgenössische Technische Hochschule Zürich, Universidade Federal de Pernambuco, Switzerland

    Ricardo Maronna, Oscar Bustos & Victor Yohai

  2. Universidad Nacional de Buenos Aires, Argentina

    Ricardo Maronna, Oscar Bustos & Victor Yohai

Authors
  1. Ricardo Maronna
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  2. Oscar Bustos
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  3. Victor Yohai
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Editor information

Th. Gasser M. Rosenblatt

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© 1979 Springer-Verlag

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Maronna, R., Bustos, O., Yohai, V. (1979). Bias- and efficiency-robustness of general M-estimators for regression with random carriers. In: Gasser, T., Rosenblatt, M. (eds) Smoothing Techniques for Curve Estimation. Lecture Notes in Mathematics, vol 757. Springer, Berlin, Heidelberg. https://doi.org/10.1007/BFb0098492

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  • DOI: https://doi.org/10.1007/BFb0098492

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-09706-8

  • Online ISBN: 978-3-540-38475-5

  • eBook Packages: Springer Book Archive

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