Abstract
The electronic structure of semimagnetic (Cd, Mn) Te involves the Mn3d states which strongly affect disorder, localized correlations, and hybridization. The model introduced here is LCAO, itinerant and incorporates both chemical disorder and magnetic moment fluctuations. Its predictions, obtained using the CPA, are compared with extensive photoemission data from the (110) face of CdTe and Cd0.5Mn0.5Te samples, measured using synchrotron light at the BESSY facility. For the first time, we identify in UPS the Mn3d states. Most of the other observed features are also classified as bulk alloy electronic structure properties.
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R. R. Galazka, Physics of Narrow Gap Semiconductors, edited by E. Gornik, H. Heinrich and L. Palmetshofer, Lecture Notes in Physics 152, (Springer Berlin, Heidelberg; New York 1982) p. 294; N. B. Brandt and V. V. Moshchalkov, Advances in Physics 33, 3 (1984).
T. Moriya and Y. Takahashi, J. Phys. Soc. Jap. 45, 397 (1978).
K. C. Hass, H. Ehrenreich and B. Velický, Phys. Rev. B27, 1088 (1983).
B. A. Orlowski, K. Kopalko and V. Cháb, Sol. State Commun. 50, 749 (1984).
P. Oelhafen, M. P. Vecchi, J. L. Freeouf and V. L. Moruzzi, Sol. State Commun. 44, 1547 (1982).
N. G. Stoffel, Phys. Rev. B28, 3306 (1983).
T. C. Chiang, J. A. Knapp, M. Aono and D. E. Eastman, Phys. Rev. B21, 3513 (1980).
P. Vogl, presented at this conference.
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© 1985 Friedr. Vieweg & Sohn Verlagsgesellschaft mbH
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Velický, B., Mašek, J., Paolucci, G., Cháb, V., Surman, M., Prince, K.C. (1985). ARUPS Studies of the electronic states of disordered, semimagnetic, semiconducting Cd1−xMnxTe. In: Grosse, P. (eds) Festkörperprobleme 25. Advances in Solid State Physics, vol 25. Springer, Berlin, Heidelberg. https://doi.org/10.1007/BFb0108156
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DOI: https://doi.org/10.1007/BFb0108156
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