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Surface characterization of 3-glycidoxypropyltrimethoxysilane films on silicon-based substrates

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Abstract

Silane coupling agents are commonly used to activate surfaces for subsequent immobilization of biomolecules. The homogeneity and surface morphology of silane films is important for controlling the structural order of immobilized single-stranded DNA probes based on oligonucleotides. The surfaces of silicon wafers and glass slides with covalently attached 3-glycidoxypropyltrimethoxysilane (GOPS) have been characterized by using angularly dependent X-ray photoelectron spectroscopy (XPS), time-of-flight secondary-ion mass spectrometry (ToF–SIMS), atomic force microscopy (AFM), scanning electron microscopy (SEM), and monochromatic and spectroscopic ellipsometry. XPS and ToF–SIMS data provided evidence of complete surface coverage by GOPS. Data from angularly resolved XPS and ellipsometry methods suggested that the GOPS films were of monolayer thickness. AFM and SEM data indicated the presence of films that consisted of nodules approximately 50–100 nm in diameter. Modeling suggested that the nodules may lead to a nanoscale structural morphology that might influence the hybridization kinetics and thermodynamics of immobilized oligonucleotides.

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Acknowledgements

We are grateful to the Natural Sciences and Engineering Research Council of Canada for financial support of this work. We would like to thank Dr Rana Sodhi from Surface Interface Ontario (SIO), St George Campus, University of Toronto, for collecting the XPS and ToF-SIMS data. We also need to thank Dr Luda Bakueva and Dr Sergei Musikhin from Dr Ted Sargent’s group, St George Campus, University of Toronto, for collecting the spectroscopic ellipsometry data. We would also like to thank Andy Mak from the University of Waterloo for collection of the AFM data. Finally, we would like to thank Dr Paul A.E. Piunno from the University of Toronto at Mississauga for his assistance in the processing of the spectroscopic ellipsometry data.

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Authors and Affiliations

  1. Chemical Sensors Group, Department of Chemical and Physical Sciences, University of Toronto at Mississauga, 3359 Mississauga Road, Mississauga, ON, L5L 1C6, Canada

    April K. Y. Wong & Ulrich J. Krull

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  1. April K. Y. Wong
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  2. Ulrich J. Krull
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Correspondence to Ulrich J. Krull.

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Wong, A.K.Y., Krull, U.J. Surface characterization of 3-glycidoxypropyltrimethoxysilane films on silicon-based substrates. Anal Bioanal Chem 383, 187–200 (2005). https://doi.org/10.1007/s00216-005-3414-y

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  • DOI: https://doi.org/10.1007/s00216-005-3414-y

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