Subthreshold regime in rubrene single-crystal organic transistors

Abstract

Organic field-effect transistors were fabricated with vapor-grown rubrene single crystals in a staggered top-contact configuration. The devices were electrically characterized by measuring the transfer curves at low drain voltage. In parallel to these measurements, a model is developed to account for the subthreshold regime of the transistors. The model is based on the multiple trapping and thermal release concept, which assumes that charge transport is limited by a single level of shallow traps located close to the transport band edge. It is shown that the threshold voltage no longer establishes at the transition between the depletion and accumulation regimes. Instead, the threshold corresponds to the point at which traps are filled. This results in a subthreshold current that varies linearly with gate voltage. Moreover, the subthreshold current at low drain voltages increases with drain voltage. These finding are in good agreement with the experimental data.