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Measurement of wurtzite ZnO/rutile TiO2 heterojunction band offsets by x-ray photoelectron spectroscopy

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Abstract

The valence-band offset of the wurtzite ZnO/rutile TiO2 heterojunction was directly determined by x-ray photoelectron spectroscopy. The wurtzite ZnO (0001) layer was grown on commercial rutile (101) TiO2 by metal-organic chemical-vapor deposition. The results show that the valence-band offset is 0.14±0.05 eV, which agrees well with previous results by other methods. Therefore, the conduction-band offset is deduced from their known band-gap energy values to be 0.45±0.05 eV, which indicates a type-II band alignment for the ZnO/TiO2 heterojunction.

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References

  1. X. Chen, S.S. Mao, Chem. Rev. 107, 2891 (2007)

    Article  Google Scholar 

  2. M. Schiavello (ed.), Photocatalysis and Environment (Kluwer Academic, Dordrecht, 1988)

    Google Scholar 

  3. D.F. Ollis, H. Al-Ekabi (eds.), Photocatalytic Purification and Treatment of Water and Air (Elsevier, Amsterdam, 1993)

    Google Scholar 

  4. Ü. Özgür, Y.I. Alivov, C. Liu, A. Teke, M.A. Reshchikov, S. Dogan, V. Avrutin, S.J. Cho, H. Morkoc, J. Appl. Phys. 98, 041301 (2005)

    Article  ADS  Google Scholar 

  5. M. Zamfirescu, A. Kavokin, B. Gil, G. Malpuech, M. Kaliteevski, Phys. Rev. B 65, 161205 (2002)

    Article  ADS  Google Scholar 

  6. J. Kasprzak, M. Richard, S. Kundermann, A. Baas, P. Jeambrun, J.M.J. Keeling, F.M. Marchetti, M.H. Szymanska, R. André, J.L. Staehli, V. Savona, P.B. Littlewood, B. Deveaud, L.S. Dang, Nature (Lond.) 443, 409 (2006)

    Article  ADS  Google Scholar 

  7. J. Pascual, J. Camassel, H. Mathieu, Phys. Rev. B 18, 5606 (1978)

    Article  ADS  Google Scholar 

  8. K. Okamoto, Y. Yamamoto, H. Tanaka, M. Tanaka, A. Itaya, Bull. Chem. Soc. Jpn. 58, 2015 (1985)

    Article  Google Scholar 

  9. J. Peral, J. Casado, J. Doménech, J. Photochem. Photobiol., A Chem. 44, 209 (1988)

    Article  Google Scholar 

  10. T. Sehili, P. Boule, J. Lemaire, J. Photochem. Photobiol., A Chem. 50, 103 (1989)

    Article  Google Scholar 

  11. T. Sehili, P. Boule, J. Lemaire, J. Photochem. Photobiol., A Chem. 50, 117 (1989)

    Article  Google Scholar 

  12. G. Marc, V. Augugliaro, M.J. Lpez-Muoz, C. Martn, L. Palmisano, V. Rives, M. Schiavello, R.J.D. Tilley, A.M. Venezia, J. Phys. Chem. B 105, 1026 (2001)

    Article  Google Scholar 

  13. B. O’Regan, M. Grätzel, Nature 353, 737 (1991)

    Article  Google Scholar 

  14. B.A. Gregg, J. Phys. Chem. B 107, 4688 (2003)

    Article  Google Scholar 

  15. M. Law, L.E. Greene, J.C. Johnson, R. Saykally, P. Yang, Nat. Mater. 4, 455 (2005)

    Article  ADS  Google Scholar 

  16. M. Gratzel, Nature 414, 228 (2001)

    Article  Google Scholar 

  17. J. Nelson, Phys. Rev. B 23, 374 (1999)

    Google Scholar 

  18. R.S. Mane, W.J. Lee, H.M. Pathan, S.H. Han, J. Phys. Chem. B 109, 24254 (2005)

    Article  Google Scholar 

  19. M. Law, L.E. Greene, A. Radenovic, T. Kuykendall, J. Liphardt, P. Yang, J. Phys. Chem. B 110, 22652 (2006)

    Article  Google Scholar 

  20. P.D.C. King, T.D. Veal, P.H. Jefferson, C.F. Mcconville, Appl. Phys. Lett. 90, 132105 (2007)

    Article  ADS  Google Scholar 

  21. H.B. Fan, S.Y. Yang, P.F. Zhang, H.Y. Wei, X.L. Liu, C.M. Jiao, Q.S. Zhu, Y.H. Chen, Z.G. Wang, Chin. Phys. Lett. 24, 2108 (2007)

    Article  ADS  Google Scholar 

  22. M.E. Kazzi, C. Merckling, G. Delhaye, L. Arzel, G. Grenet, E. Bergignat, G. Hollinger, Mater. Sci. Semicond. Process 9, 954 (2006)

    Article  Google Scholar 

  23. Y. Xu, M.A. Schoonen, Am. Mineral. 85, 543 (2000)

    Google Scholar 

  24. J. Pascual, J. Camassel, H. Mathieu, Phys. Rev. B 18, 5606 (1978)

    Article  ADS  Google Scholar 

Download references

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Authors and Affiliations

  1. Key Laboratory of Semiconductor Materials Science, Institute of Semiconductors, Chinese Academy of Sciences, P.O. Box 912, Beijing, 100083, People’s Republic of China

    Jun Wang, Xiang-Lin Liu, An-Li Yang, Gao-Lin Zheng, Shao-Yan Yang, Hong-Yuan Wei, Qin-Sheng Zhu & Zhan-Guo Wang

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  1. Jun Wang
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  2. Xiang-Lin Liu
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  3. An-Li Yang
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Correspondence to Xiang-Lin Liu.

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Wang, J., Liu, XL., Yang, AL. et al. Measurement of wurtzite ZnO/rutile TiO2 heterojunction band offsets by x-ray photoelectron spectroscopy. Appl. Phys. A 103, 1099–1103 (2011). https://doi.org/10.1007/s00339-010-6048-7

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