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Reverse engineering from spectrophotometric measurements: performances and efficiency of different optimization algorithms

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Abstract

A large number of parameters is often required to describe optical dispersion laws, and it is only through the use of an appropriate global optimization procedure that an accurate thin-film index determination can be achieved. In this paper, we propose to investigate the respective performances of three different optimization algorithms, namely Simulated Annealing, Genetic Algorithm and Clustering Global Optimization and compare results with a commercial software dedicated to thin-film index determination. This study is restricted to the single-layer thin-film index determination of transparent and absorbing materials. It includes the theoretical study of simulated reflection and transmission spectra, and the experimental characterization of Ta2O5 and Si layers.

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Acknowledgements

This program has been supported by the French “Agence National de la Recherche” (ANR PNANO SEEC).

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Authors and Affiliations

  1. Institut Fresnel, UMR 6133 CNRS, Campus de St Jérôme, 13397, Marseille cedex 20, France

    Lihong Gao, Fabien Lemarchand & Michel Lequime

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  1. Lihong Gao
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  2. Fabien Lemarchand
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  3. Michel Lequime
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Correspondence to Fabien Lemarchand.

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Gao, L., Lemarchand, F. & Lequime, M. Reverse engineering from spectrophotometric measurements: performances and efficiency of different optimization algorithms. Appl. Phys. A 108, 877–889 (2012). https://doi.org/10.1007/s00339-012-6987-2

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  • DOI: https://doi.org/10.1007/s00339-012-6987-2

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